Terahertz time-domain spectroscopy of NiOx thin films

Taewoo Ha; Kyujin Choi; Cheol Hyeok Lee; Kimoon Lee; Seongil Im; Jae Hoon Kim

doi:10.1109/ICIMW.2009.5325557

Terahertz time-domain spectroscopy of NiO_x thin films

Taewoo Ha, Kyujin Choi, Cheol Hyeok Lee, Kimoon Lee, Seongil Im, Jae Hoon Kim

Department of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

We have measured the terahertz transmittance of NiO_x thin films grown on Si by thermal evaporation. The frequency-dependent conductivities were determined without resorting to a Kramers-Kronig analysis. Large changes in these spectral functions occurred due to varying deposition rate and annealing temperature. We observed a direct correlation between these parameters with the electronic and optical properties of NiO_x thin films.

Original language	English
Title of host publication	34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009
DOIs	https://doi.org/10.1109/ICIMW.2009.5325557
Publication status	Published - 2009 Dec 1
Event	34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009 - Busan, Korea, Republic of Duration: 2009 Sep 21 → 2009 Sep 25

Publication series

Name	34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009

Other

Other	34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009
Country	Korea, Republic of
City	Busan
Period	09/9/21 → 09/9/25

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All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering
Communication

Cite this

Ha, T., Choi, K., Lee, C. H., Lee, K., Im, S., & Kim, J. H. (2009). Terahertz time-domain spectroscopy of NiO_x thin films. In 34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009 [5325557] (34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009). https://doi.org/10.1109/ICIMW.2009.5325557

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title = "Terahertz time-domain spectroscopy of NiOx thin films",

abstract = "We have measured the terahertz transmittance of NiOx thin films grown on Si by thermal evaporation. The frequency-dependent conductivities were determined without resorting to a Kramers-Kronig analysis. Large changes in these spectral functions occurred due to varying deposition rate and annealing temperature. We observed a direct correlation between these parameters with the electronic and optical properties of NiOx thin films.",

author = "Taewoo Ha and Kyujin Choi and Lee, {Cheol Hyeok} and Kimoon Lee and Seongil Im and Kim, {Jae Hoon}",

year = "2009",

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doi = "10.1109/ICIMW.2009.5325557",

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series = "34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009",

booktitle = "34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009",

note = "34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009 ; Conference date: 21-09-2009 Through 25-09-2009",

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Ha, T, Choi, K, Lee, CH, Lee, K, Im, S & Kim, JH 2009, Terahertz time-domain spectroscopy of NiO_x thin films. in 34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009., 5325557, 34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009, 34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009, Busan, Korea, Republic of, 09/9/21. https://doi.org/10.1109/ICIMW.2009.5325557

Terahertz time-domain spectroscopy of NiO_x thin films. / Ha, Taewoo; Choi, Kyujin; Lee, Cheol Hyeok; Lee, Kimoon; Im, Seongil ; Kim, Jae Hoon.

34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009. 2009. 5325557 (34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AU - Ha, Taewoo

AU - Choi, Kyujin

AU - Lee, Cheol Hyeok

AU - Lee, Kimoon

AU - Im, Seongil

AU - Kim, Jae Hoon

PY - 2009/12/1

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N2 - We have measured the terahertz transmittance of NiOx thin films grown on Si by thermal evaporation. The frequency-dependent conductivities were determined without resorting to a Kramers-Kronig analysis. Large changes in these spectral functions occurred due to varying deposition rate and annealing temperature. We observed a direct correlation between these parameters with the electronic and optical properties of NiOx thin films.

AB - We have measured the terahertz transmittance of NiOx thin films grown on Si by thermal evaporation. The frequency-dependent conductivities were determined without resorting to a Kramers-Kronig analysis. Large changes in these spectral functions occurred due to varying deposition rate and annealing temperature. We observed a direct correlation between these parameters with the electronic and optical properties of NiOx thin films.

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AN - SCOPUS:73049104269

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T3 - 34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009

BT - 34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009

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Access to Document

10.1109/ICIMW.2009.5325557