TY - GEN
T1 - Terahertz time-domain spectroscopy of NiOx thin films
AU - Ha, Taewoo
AU - Choi, Kyujin
AU - Lee, Cheol Hyeok
AU - Lee, Kimoon
AU - Im, Seongil
AU - Kim, Jae Hoon
PY - 2009
Y1 - 2009
N2 - We have measured the terahertz transmittance of NiOx thin films grown on Si by thermal evaporation. The frequency-dependent conductivities were determined without resorting to a Kramers-Kronig analysis. Large changes in these spectral functions occurred due to varying deposition rate and annealing temperature. We observed a direct correlation between these parameters with the electronic and optical properties of NiOx thin films.
AB - We have measured the terahertz transmittance of NiOx thin films grown on Si by thermal evaporation. The frequency-dependent conductivities were determined without resorting to a Kramers-Kronig analysis. Large changes in these spectral functions occurred due to varying deposition rate and annealing temperature. We observed a direct correlation between these parameters with the electronic and optical properties of NiOx thin films.
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U2 - 10.1109/ICIMW.2009.5325557
DO - 10.1109/ICIMW.2009.5325557
M3 - Conference contribution
AN - SCOPUS:73049104269
SN - 9781424454174
T3 - 34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009
BT - 34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009
T2 - 34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009
Y2 - 21 September 2009 through 25 September 2009
ER -