Terahertz time-domain spectroscopy of NiOx thin films

Taewoo Ha, Kyujin Choi, Cheol Hyeok Lee, Kimoon Lee, Seongil Im, Jae Hoon Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We have measured the terahertz transmittance of NiOx thin films grown on Si by thermal evaporation. The frequency-dependent conductivities were determined without resorting to a Kramers-Kronig analysis. Large changes in these spectral functions occurred due to varying deposition rate and annealing temperature. We observed a direct correlation between these parameters with the electronic and optical properties of NiOx thin films.

Original languageEnglish
Title of host publication34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009
DOIs
Publication statusPublished - 2009 Dec 1
Event34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009 - Busan, Korea, Republic of
Duration: 2009 Sep 212009 Sep 25

Publication series

Name34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009

Other

Other34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009
CountryKorea, Republic of
CityBusan
Period09/9/2109/9/25

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All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Communication

Cite this

Ha, T., Choi, K., Lee, C. H., Lee, K., Im, S., & Kim, J. H. (2009). Terahertz time-domain spectroscopy of NiOx thin films. In 34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009 [5325557] (34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009). https://doi.org/10.1109/ICIMW.2009.5325557