Test access mechaism for stack test time reduction of 3-dimensional integrated circuit

Inhyuk Choi, Hyunggoy Oh, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint

Dive into the research topics of 'Test access mechaism for stack test time reduction of 3-dimensional integrated circuit'. Together they form a unique fingerprint.

Engineering

Earth and Planetary Sciences

Computer Science

Physics