Test case generation of a protocol by a fault coverage analysis

Tae Hyong Kim, Ik Soon Hwang, Min Seok Jang, Sung Won Kang, Jai Yong Lee, Sang Bae Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In this paper we generate conformance test cases for a communication protocol modeled in an EFSM(Extended Finite State Machine) by a fault coverage analysis. For the analysis model, we choose the expanded EFSM to resolve the inter-dependency problem between control and data flows within an EFSM. An expanded EFSM has several useful properties and makes it easy to generate test cases. For test case generation, at first we define data elements in the expanded EFSM. With the definition, we define some probable fault models in edges of the expanded EFSM and discuss what test cases to be needed for satisfying each fault model. The analysis shows that control flow test cases with full fault coverage and data flow test cases satisfying 'all-du-paths' criterion are needed to guarantee high fault coverage in the expanded EFSM. A mass of generated test cases by high fault coverage is optimized through some steps. The result of a simple protocol shows the efficacy of this method.

Original languageEnglish
Title of host publicationProceedings - 12th International Conference on Information Networking, ICOIN 1998
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages690-695
Number of pages6
ISBN (Electronic)0818672250, 9780818672255
DOIs
Publication statusPublished - 1998 Jan 1
Event12th International Conference on Information Networking, ICOIN 1998 - Koganei, Tokyo, Japan
Duration: 1998 Jan 211998 Jan 23

Publication series

NameProceedings - 12th International Conference on Information Networking, ICOIN 1998

Conference

Conference12th International Conference on Information Networking, ICOIN 1998
CountryJapan
CityKoganei, Tokyo
Period98/1/2198/1/23

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All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Hardware and Architecture
  • Information Systems

Cite this

Kim, T. H., Hwang, I. S., Jang, M. S., Kang, S. W., Lee, J. Y., & Lee, S. B. (1998). Test case generation of a protocol by a fault coverage analysis. In Proceedings - 12th International Conference on Information Networking, ICOIN 1998 (pp. 690-695). (Proceedings - 12th International Conference on Information Networking, ICOIN 1998). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICOIN.1998.648603