Test case generation of a protocol by a fault coverage analysis

Tae Hyong Kim, Ik Soon Hwang, Min Seok Jang, Sung Won Kang, Jai Yong Lee, Sang Bae Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Fingerprint Dive into the research topics of 'Test case generation of a protocol by a fault coverage analysis'. Together they form a unique fingerprint.

Engineering & Materials Science