Test cost reduction for X-value elimination by scan slice correlation analysis

Hyunsu Chae, Joon Sung Yang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

X-values in test output responses corrupt an output response compaction and can cause a fault coverage loss. X-Masking and XCanceling MISR methods have been suggested to eliminate Xvalues, however, there are control data volume and test time overhead issues. These issues become significant as the complexity and the density of the circuits increase. This paper proposes a method to eliminate X's by applying a scan slice granularity Xvalue correlation analysis. The proposed method exploits scan slice correlation analysis, determines unique control data for the scan slice groups sharing the same control data, and applies them for each scan slice. Hence, the volume of control data can be significantly reduced. The simulation results demonstrate that the proposed method achieves greater control data and test time reduction compared to the conventional methods, without loss of fault coverage.

Original languageEnglish
Title of host publicationProceedings of the 55th Annual Design Automation Conference, DAC 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781450357005
DOIs
Publication statusPublished - 2018 Jun 24
Event55th Annual Design Automation Conference, DAC 2018 - San Francisco, United States
Duration: 2018 Jun 242018 Jun 29

Publication series

NameProceedings - Design Automation Conference
VolumePart F137710
ISSN (Print)0738-100X

Conference

Conference55th Annual Design Automation Conference, DAC 2018
CountryUnited States
CitySan Francisco
Period18/6/2418/6/29

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Modelling and Simulation

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  • Cite this

    Chae, H., & Yang, J. S. (2018). Test cost reduction for X-value elimination by scan slice correlation analysis. In Proceedings of the 55th Annual Design Automation Conference, DAC 2018 [a78] (Proceedings - Design Automation Conference; Vol. Part F137710). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1145/3195970.3196127