Test-Decompression Mechanism Using a Variable-Length Multiple-Polynomial LFSR

Hong Sik Kim, Yongjoon Kim, Sungho Kang

Research output: Contribution to journalArticle

15 Citations (Scopus)


A new test-decompression methodology using a variable-rank multiple-polynomial linear feedback shift register (MP-LFSR) is proposed. In the proposed reseeding scheme, a test cube with a large number of specified bits is encoded with a high-rank polynomial, while a test cube with a small number of specified bits is encoded with a low-rank polynomial. Therefore, according to the number of specified bits in each test cube, the size of the encoded data can be optimally reduced. A variable-rank MP-LFSR can be implemented with a slight modification of a conventional MP-LFSR. The experimental results on the largest ISCAS'89 benchmark circuits show that the proposed methodology can provide much better encoding efficiency than the previous methods with adequate hardware overhead.

Original languageEnglish
Pages (from-to)687-690
Number of pages4
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Issue number4
Publication statusPublished - 2003 Aug 1


All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

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