Test-Decompression Mechanism Using a Variable-Length Multiple-Polynomial LFSR

Hong Sik Kim; Yongjoon Kim; Sungho Kang

doi:10.1109/TVLSI.2003.812287

Test-Decompression Mechanism Using a Variable-Length Multiple-Polynomial LFSR

Hong Sik Kim, Yongjoon Kim, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

15 Citations (Scopus)

Abstract

A new test-decompression methodology using a variable-rank multiple-polynomial linear feedback shift register (MP-LFSR) is proposed. In the proposed reseeding scheme, a test cube with a large number of specified bits is encoded with a high-rank polynomial, while a test cube with a small number of specified bits is encoded with a low-rank polynomial. Therefore, according to the number of specified bits in each test cube, the size of the encoded data can be optimally reduced. A variable-rank MP-LFSR can be implemented with a slight modification of a conventional MP-LFSR. The experimental results on the largest ISCAS'89 benchmark circuits show that the proposed methodology can provide much better encoding efficiency than the previous methods with adequate hardware overhead.

Original language	English
Pages (from-to)	687-690
Number of pages	4
Journal	IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume	11
Issue number	4
DOIs	https://doi.org/10.1109/TVLSI.2003.812287
Publication status	Published - 2003 Aug

All Science Journal Classification (ASJC) codes

Software
Hardware and Architecture
Electrical and Electronic Engineering

Access to Document

10.1109/TVLSI.2003.812287

Fingerprint Dive into the research topics of 'Test-Decompression Mechanism Using a Variable-Length Multiple-Polynomial LFSR'. Together they form a unique fingerprint.

Cite this

@article{6afe59377e4a44bdab8f157fa7fe3be7,

title = "Test-Decompression Mechanism Using a Variable-Length Multiple-Polynomial LFSR",

abstract = "A new test-decompression methodology using a variable-rank multiple-polynomial linear feedback shift register (MP-LFSR) is proposed. In the proposed reseeding scheme, a test cube with a large number of specified bits is encoded with a high-rank polynomial, while a test cube with a small number of specified bits is encoded with a low-rank polynomial. Therefore, according to the number of specified bits in each test cube, the size of the encoded data can be optimally reduced. A variable-rank MP-LFSR can be implemented with a slight modification of a conventional MP-LFSR. The experimental results on the largest ISCAS'89 benchmark circuits show that the proposed methodology can provide much better encoding efficiency than the previous methods with adequate hardware overhead.",

author = "Kim, {Hong Sik} and Yongjoon Kim and Sungho Kang",

year = "2003",

month = aug,

doi = "10.1109/TVLSI.2003.812287",

language = "English",

volume = "11",

pages = "687--690",

journal = "IEEE Transactions on Very Large Scale Integration (VLSI) Systems",

issn = "1063-8210",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "4",

}

TY - JOUR

T1 - Test-Decompression Mechanism Using a Variable-Length Multiple-Polynomial LFSR

AU - Kim, Hong Sik

AU - Kim, Yongjoon

AU - Kang, Sungho

PY - 2003/8

Y1 - 2003/8

N2 - A new test-decompression methodology using a variable-rank multiple-polynomial linear feedback shift register (MP-LFSR) is proposed. In the proposed reseeding scheme, a test cube with a large number of specified bits is encoded with a high-rank polynomial, while a test cube with a small number of specified bits is encoded with a low-rank polynomial. Therefore, according to the number of specified bits in each test cube, the size of the encoded data can be optimally reduced. A variable-rank MP-LFSR can be implemented with a slight modification of a conventional MP-LFSR. The experimental results on the largest ISCAS'89 benchmark circuits show that the proposed methodology can provide much better encoding efficiency than the previous methods with adequate hardware overhead.

AB - A new test-decompression methodology using a variable-rank multiple-polynomial linear feedback shift register (MP-LFSR) is proposed. In the proposed reseeding scheme, a test cube with a large number of specified bits is encoded with a high-rank polynomial, while a test cube with a small number of specified bits is encoded with a low-rank polynomial. Therefore, according to the number of specified bits in each test cube, the size of the encoded data can be optimally reduced. A variable-rank MP-LFSR can be implemented with a slight modification of a conventional MP-LFSR. The experimental results on the largest ISCAS'89 benchmark circuits show that the proposed methodology can provide much better encoding efficiency than the previous methods with adequate hardware overhead.

UR - http://www.scopus.com/inward/record.url?scp=0141527464&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0141527464&partnerID=8YFLogxK

U2 - 10.1109/TVLSI.2003.812287

DO - 10.1109/TVLSI.2003.812287

M3 - Article

AN - SCOPUS:0141527464

VL - 11

SP - 687

EP - 690

JO - IEEE Transactions on Very Large Scale Integration (VLSI) Systems

JF - IEEE Transactions on Very Large Scale Integration (VLSI) Systems

SN - 1063-8210

IS - 4

ER -

Test-Decompression Mechanism Using a Variable-Length Multiple-Polynomial LFSR

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Cite this