In this paper, a design for debug (DFD) method that reuses test resources is proposed to reduce the debug cost in post-silicon validation. With the proposed method, the trace buffer is shared for embedded cores to capture the signatures of each core concurrently by reusing a test access mechanism. In this case, the depth of the trace buffer allocated to the core is reconfigurable and variable according to debug scheme. The experimental results indicate that the proposed DFD significantly reduces the debug time when the trace buffer is shared by cores in various debug cases.
Bibliographical noteFunding Information:
This research was supported by the MOTIE (Ministry of Trade, Industry & Energy) (10067813) and KSRC (Korea Semiconductor Research Consortium) support program for the development of the future semiconductor device.
© 1968-2012 IEEE.
All Science Journal Classification (ASJC) codes
- Theoretical Computer Science
- Hardware and Architecture
- Computational Theory and Mathematics