Test scheduling of NoC-based SoCs using multiple test clocks

Jin Ho Ahn, Sungho Kang

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

Network-on-chip (NoC) is an emerging design paradigm intended to cope with future systems-on-chips (SoCs) containing numerous built-in cores. Since NoCs have some outstanding features regarding design complexity, timing, scalability, power dissipation and so on, widespread interest in this novel paradigm is likely to grow. The test strategy is a significant factor in the practicality and feasibility of NoC-based SoCs. Among the existing test issues for NoC-based SoCs, test access mechanism architecture and test scheduling particularly dominate the overall test performance. In this paper, we propose an efficient NoC-based SoC test scheduling algorithm based on a rectangle packing approach used for current SoC tests. In order to adopt the rectangle packing solution, we designed specific methods and configurations for testing NoC-based SoCs, such as test packet routing, test pattern generation, and absorption. Furthermore, we extended and improved the proposed algorithm using multiple test clocks. Experimental results using some ITC'02 benchmark circuits show that the proposed algorithm can reduce the overall test time by up to 55%, and 20% on average compared with previous works. In addition, the computation time of the algorithm is less than one second in most cases. Consequently, we expect the proposed scheduling algorithm to be a promising and competitive method for testing NoC-based SoCs.

Original languageEnglish
Pages (from-to)475-485
Number of pages11
JournalETRI Journal
Volume28
Issue number4
DOIs
Publication statusPublished - 2006

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Computer Science(all)
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Test scheduling of NoC-based SoCs using multiple test clocks'. Together they form a unique fingerprint.

  • Cite this