Test selection for a nondeterministic FSM

I. Hwang; T. Kim; S. Hong; J. Lee

doi:10.1016/S0140-3664(00)00327-3

Test selection for a nondeterministic FSM

I. Hwang, T. Kim, S. Hong, J. Lee

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

20 Citations (Scopus)

Abstract

In testing Nondeterministic Finite State Machines (NFSMs), testing process becomes hypothesis testing, if test sequence repetition numbers are not large enough to satisfy the so-called complete-testing assumption. In this paper, we present a method to determine the repetition numbers of test sequences assuming that each transition is executed with a fixed probability when nondeterministic choice is made. The proposed method ensures the test pass probability of restricted class of faulty machines to be never greater than a given value. Also, we discuss how to select a test suite for NFSMs that guarantees the minimal total test length.

Original language	English
Pages (from-to)	1213-1223
Number of pages	11
Journal	Computer Communications
Volume	24
Issue number	12
DOIs	https://doi.org/10.1016/S0140-3664(00)00327-3
Publication status	Published - 2001 Jul 15

All Science Journal Classification (ASJC) codes

Computer Networks and Communications

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Test selection for a nondeterministic FSM

Abstract

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