Test sequence generation scheme satisfying the completeness criteria

Hong Se Son, Dae Hun Nyang, Jin Ho Park, Sang Yong Lim, Byung Moon Chin, Jun Won Lee, Joo Seok Song

Research output: Contribution to conferencePaper

Abstract

We present a problem of commonly used characterization sequences and propose a new test sequence to resolve the problem. The proposed test sequence could decide whether the output fault arises in the edge being tested or one of edges in the UIO sequence. Additionally, the fault coverage is much wider than other test sequence generation methods. To achieve the goal, we introduce k-strong FSM, and show that it can be constructed from a characterization sequence. Also, we illustrate our technique on a specific example.

Original languageEnglish
Pages560-563
Number of pages4
Publication statusPublished - 1997 Dec 1
EventProceedings of the 1997 6th IEEE Pacific Rim Conference on Communications, Computers and Signal Processing. Part 1 (of 2) - Victoria, Can
Duration: 1997 Aug 201997 Aug 22

Other

OtherProceedings of the 1997 6th IEEE Pacific Rim Conference on Communications, Computers and Signal Processing. Part 1 (of 2)
CityVictoria, Can
Period97/8/2097/8/22

All Science Journal Classification (ASJC) codes

  • Signal Processing
  • Computer Networks and Communications

Cite this

Son, H. S., Nyang, D. H., Park, J. H., Lim, S. Y., Chin, B. M., Lee, J. W., & Song, J. S. (1997). Test sequence generation scheme satisfying the completeness criteria. 560-563. Paper presented at Proceedings of the 1997 6th IEEE Pacific Rim Conference on Communications, Computers and Signal Processing. Part 1 (of 2), Victoria, Can, .
Son, Hong Se ; Nyang, Dae Hun ; Park, Jin Ho ; Lim, Sang Yong ; Chin, Byung Moon ; Lee, Jun Won ; Song, Joo Seok. / Test sequence generation scheme satisfying the completeness criteria. Paper presented at Proceedings of the 1997 6th IEEE Pacific Rim Conference on Communications, Computers and Signal Processing. Part 1 (of 2), Victoria, Can, .4 p.
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author = "Son, {Hong Se} and Nyang, {Dae Hun} and Park, {Jin Ho} and Lim, {Sang Yong} and Chin, {Byung Moon} and Lee, {Jun Won} and Song, {Joo Seok}",
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Son, HS, Nyang, DH, Park, JH, Lim, SY, Chin, BM, Lee, JW & Song, JS 1997, 'Test sequence generation scheme satisfying the completeness criteria' Paper presented at Proceedings of the 1997 6th IEEE Pacific Rim Conference on Communications, Computers and Signal Processing. Part 1 (of 2), Victoria, Can, 97/8/20 - 97/8/22, pp. 560-563.

Test sequence generation scheme satisfying the completeness criteria. / Son, Hong Se; Nyang, Dae Hun; Park, Jin Ho; Lim, Sang Yong; Chin, Byung Moon; Lee, Jun Won; Song, Joo Seok.

1997. 560-563 Paper presented at Proceedings of the 1997 6th IEEE Pacific Rim Conference on Communications, Computers and Signal Processing. Part 1 (of 2), Victoria, Can, .

Research output: Contribution to conferencePaper

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AU - Nyang, Dae Hun

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AU - Lim, Sang Yong

AU - Chin, Byung Moon

AU - Lee, Jun Won

AU - Song, Joo Seok

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N2 - We present a problem of commonly used characterization sequences and propose a new test sequence to resolve the problem. The proposed test sequence could decide whether the output fault arises in the edge being tested or one of edges in the UIO sequence. Additionally, the fault coverage is much wider than other test sequence generation methods. To achieve the goal, we introduce k-strong FSM, and show that it can be constructed from a characterization sequence. Also, we illustrate our technique on a specific example.

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Son HS, Nyang DH, Park JH, Lim SY, Chin BM, Lee JW et al. Test sequence generation scheme satisfying the completeness criteria. 1997. Paper presented at Proceedings of the 1997 6th IEEE Pacific Rim Conference on Communications, Computers and Signal Processing. Part 1 (of 2), Victoria, Can, .