The effect of dynamic bias stress on the photon-enhanced threshold voltage instability of amorphous HfInZnO thin-film transistors

Kyoung Seok Son, Hyun Suk Kim, Wan Joo Maeng, Ji Sim Jung, Kwang Hee Lee, Tae Sang Kim, Joon Seok Park, Jang Yeon Kwon, Bonwon Koo, Sang Yoon Lee

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)

Fingerprint

Dive into the research topics of 'The effect of dynamic bias stress on the photon-enhanced threshold voltage instability of amorphous HfInZnO thin-film transistors'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemistry