La0.7-xGdxSr0.3MnO3(LSGMO: x = 0.1, 0.3, and 0.5) perovskite manganite thin films were formed on a Pt(111)/Ti/SiO2/Si(100) substrate heated to 500°C using a radio frequency magnetron sputter. The effects of substituted Gd3+on the physical, chemical, and electrical properties of perovskite manganite thin films were systematically investigated. X-ray diffraction results showed that the crystallinity of the films was affected by the substitution of La3+with Gd3+ions. Raman spectroscopy analysis showed an increase in both the tilt of the MnO6octahedron and the structural distortion as a result of Gd3+substitution. This is due to the increased structural instability of LSGMO associated with the rhombohedral structure, which can be contrasted with a stable crystalline structure of Gd0.7Sr0.3MnO3such as orthorhombic. From the above analyses, it was revealed that structural distortion, crystallinity, and bond strength could affect on resistive switching property.
|Number of pages||4|
|Journal||Journal of the Ceramic Society of Japan|
|Publication status||Published - 2014 Aug 1|
Bibliographical notePublisher Copyright:
© 2014 The Ceramic Society of Japan. All rights reserved.
All Science Journal Classification (ASJC) codes
- Ceramics and Composites
- Condensed Matter Physics
- Materials Chemistry