La0.7-xGdxSr0.3MnO3(LSGMO: x = 0.1, 0.3, and 0.5) perovskite manganite thin films were formed on a Pt(111)/Ti/SiO2/Si(100) substrate heated to 500°C using a radio frequency magnetron sputter. The effects of substituted Gd3+on the physical, chemical, and electrical properties of perovskite manganite thin films were systematically investigated. X-ray diffraction results showed that the crystallinity of the films was affected by the substitution of La3+with Gd3+ions. Raman spectroscopy analysis showed an increase in both the tilt of the MnO6octahedron and the structural distortion as a result of Gd3+substitution. This is due to the increased structural instability of LSGMO associated with the rhombohedral structure, which can be contrasted with a stable crystalline structure of Gd0.7Sr0.3MnO3such as orthorhombic. From the above analyses, it was revealed that structural distortion, crystallinity, and bond strength could affect on resistive switching property.
All Science Journal Classification (ASJC) codes
- Ceramics and Composites
- Condensed Matter Physics
- Materials Chemistry