Abstract
La0.7-xGdxSr0.3MnO3(LSGMO: x = 0.1, 0.3, and 0.5) perovskite manganite thin films were formed on a Pt(111)/Ti/SiO2/Si(100) substrate heated to 500°C using a radio frequency magnetron sputter. The effects of substituted Gd3+on the physical, chemical, and electrical properties of perovskite manganite thin films were systematically investigated. X-ray diffraction results showed that the crystallinity of the films was affected by the substitution of La3+with Gd3+ions. Raman spectroscopy analysis showed an increase in both the tilt of the MnO6octahedron and the structural distortion as a result of Gd3+substitution. This is due to the increased structural instability of LSGMO associated with the rhombohedral structure, which can be contrasted with a stable crystalline structure of Gd0.7Sr0.3MnO3such as orthorhombic. From the above analyses, it was revealed that structural distortion, crystallinity, and bond strength could affect on resistive switching property.
Original language | English |
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Pages (from-to) | 622-625 |
Number of pages | 4 |
Journal | Journal of the Ceramic Society of Japan |
Volume | 122 |
Issue number | 1428 |
DOIs | |
Publication status | Published - 2014 Aug 1 |
Bibliographical note
Publisher Copyright:© 2014 The Ceramic Society of Japan. All rights reserved.
All Science Journal Classification (ASJC) codes
- Ceramics and Composites
- Chemistry(all)
- Condensed Matter Physics
- Materials Chemistry