The effect of moisture on the photon-enhanced negative bias thermal instability in Ga-In-Zn-O thin film transistors

Kwang Hee Lee, Ji Sim Jung, Kyoung Seok Son, Joon Seok Park, Tae Sang Kim, Rino Choi, Jae Kyeong Jeong, Jang Yeon Kwon, Bonwon Koo, Sangyun Lee

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293 Citations (Scopus)

Abstract

We investigated the impact of photon irradiation on the stability of gallium-indium-zinc oxide (GIZO) thin film transistors. The application of light on the negative bias temperature stress (NBTS) accelerated the negative displacement of the threshold voltage (Vth). This phenomenon can be attributed to the trapping of the photon-induced carriers into the gate dielectric/channel interface or the gate dielectric bulk. Interestingly, the negative Vth shift under photon-enhanced NBTS condition worsened in relatively humid environments. It is suggested that moisture is a significant parameter that induces the degradation of bias-stressed GIZO transistors.

Original languageEnglish
Article number232106
JournalApplied Physics Letters
Volume95
Issue number23
DOIs
Publication statusPublished - 2009

Bibliographical note

Funding Information:
J.K.J acknowledges the support of Inha University Research Grant (Grant No. INHA-39250).

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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