The effect of rod obstruction on transition speed of large flow oscillation in co-rotating disks

Dae Wee Kong, Won Gu Joo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The trend in the computer industry to produce smaller disk drives rotating at higher speeds requires an improved understanding of fluid motion in the space between disks. The distribution of pressure disturbance on disks has relation to flow structure. To investigate the flow structure, the circumferential velocity was obtained using hot-wire measurements for the flow between the center pair of four disks of common radius R2 co-rotating at angular velocity σ in a fixed cylindrical enclosure. Disk radius is about 4 times larger than usual one of HDD to detect detail velocity profile. Hot-wire supporter acts as an obstruction in this case. The effects of rotating speed on large flow oscillation in outer region with hotwire supporter were investigated.

Original languageEnglish
Title of host publicationAsia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages101-102
Number of pages2
ISBN (Electronic)0780387171, 9780780387171
DOIs
Publication statusPublished - 2004 Jan 1
Event2004 Asia-Pacific Magnetic Recording Conference, APMRC 2004 - Seoul, Korea, Republic of
Duration: 2004 Aug 162004 Aug 19

Publication series

NameAsia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004

Other

Other2004 Asia-Pacific Magnetic Recording Conference, APMRC 2004
CountryKorea, Republic of
CitySeoul
Period04/8/1604/8/19

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All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Kong, D. W., & Joo, W. G. (2004). The effect of rod obstruction on transition speed of large flow oscillation in co-rotating disks. In Asia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004 (pp. 101-102). [1521971] (Asia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APMRC.2004.1521971