The impact of device configuration on the photon-enhanced negative bias thermal instability of GaInZnO thin film transistors

Engineering & Materials Science

• Thin film transistors 100%
• Photons 92%
• Molybdenum 60%
• Transistors 44%
• Dry etching 37%
• Hot Temperature 37%
• Gallium 37%
• Zinc oxide 34%
• Indium 33%
• Lighting 20%
• Degradation 18%
• Temperature 10%

Physics & Astronomy

• thermal instability 99%
• transistors 62%
• molybdenum 51%
• photons 43%
• configurations 41%
• thin films 40%
• gallium 26%
• indium oxides 25%
• illumination 19%
• etching 19%
• degradation 19%
• shift 15%
• temperature 7%

Chemical Compounds

• Zinc Oxide 38%
• Etching 35%
• Illumination 34%