The impact of device configuration on the photon-enhanced negative bias thermal instability of GaInZnO thin film transistors

Jang Yeon Kwon, Kyoung Seok Son, Ji Sim Jung, Kwang Hee Lee, Joon Seok Park, Tae Sang Kim, Kwang Hwan Ji, Rino Choi, Jae Kyeong Jeong, Bonwon Koo, Sangyun Lee

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