The impact of gate dielectric materials on the light-induced bias instability in Hf-In-Zn-O thin film transistor

Jang Yeon Kwon, Ji Sim Jung, Kyoung Seok Son, Kwang Hee Lee, Joon Seok Park, Tae Sang Kim, Jin Seong Park, Rino Choi, Jae Kyeong Jeong, Bonwon Koo, Sang Yoon Lee

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Physics & Astronomy