Abstract
The electronic structure of tris(8-hydroquinoline) aluminum (Al q3) /rubrene/poly(ethylene glycol) dimethyl ether (PEGDE)/Al interfaces was studied using in situ ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). The UPS and XPS spectra allowed us to evaluate the complete energy level diagrams and to analyze the chemical interactions at the interfaces. When a PEGDE/rubrene double layer was inserted between Al and Al q3, the electron injection barrier height was greatly reduced compared to the interface without PEGDE/rubrene or with a single insertion layer of either PEGDE or rubrene.
| Original language | English |
|---|---|
| Article number | 152107 |
| Journal | Applied Physics Letters |
| Volume | 91 |
| Issue number | 15 |
| DOIs | |
| Publication status | Published - 2007 Oct 18 |
Fingerprint
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)
Cite this
}
The origin of electron injection improvement in organic light-emitting devices with an organic oxide/rubrene electron injection layer. / Cho, Kwanghee; Cho, Sang Wan; Whang, Chung Nam; Jeong, Kwangho; Kang, Seong Jun; Yi, Yeonjin.
In: Applied Physics Letters, Vol. 91, No. 15, 152107, 18.10.2007.Research output: Contribution to journal › Article
TY - JOUR
T1 - The origin of electron injection improvement in organic light-emitting devices with an organic oxide/rubrene electron injection layer
AU - Cho, Kwanghee
AU - Cho, Sang Wan
AU - Whang, Chung Nam
AU - Jeong, Kwangho
AU - Kang, Seong Jun
AU - Yi, Yeonjin
PY - 2007/10/18
Y1 - 2007/10/18
N2 - The electronic structure of tris(8-hydroquinoline) aluminum (Al q3) /rubrene/poly(ethylene glycol) dimethyl ether (PEGDE)/Al interfaces was studied using in situ ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). The UPS and XPS spectra allowed us to evaluate the complete energy level diagrams and to analyze the chemical interactions at the interfaces. When a PEGDE/rubrene double layer was inserted between Al and Al q3, the electron injection barrier height was greatly reduced compared to the interface without PEGDE/rubrene or with a single insertion layer of either PEGDE or rubrene.
AB - The electronic structure of tris(8-hydroquinoline) aluminum (Al q3) /rubrene/poly(ethylene glycol) dimethyl ether (PEGDE)/Al interfaces was studied using in situ ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). The UPS and XPS spectra allowed us to evaluate the complete energy level diagrams and to analyze the chemical interactions at the interfaces. When a PEGDE/rubrene double layer was inserted between Al and Al q3, the electron injection barrier height was greatly reduced compared to the interface without PEGDE/rubrene or with a single insertion layer of either PEGDE or rubrene.
UR - http://www.scopus.com/inward/record.url?scp=35248822152&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=35248822152&partnerID=8YFLogxK
U2 - 10.1063/1.2798588
DO - 10.1063/1.2798588
M3 - Article
AN - SCOPUS:35248822152
VL - 91
JO - Applied Physics Letters
JF - Applied Physics Letters
SN - 0003-6951
IS - 15
M1 - 152107
ER -