The origin of electron injection improvement in organic light-emitting devices with an organic oxide/rubrene electron injection layer

Kwanghee Cho, Sang Wan Cho, Chung Nam Whang, Kwangho Jeong, Seong Jun Kang, Yeonjin Yi

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The electronic structure of tris(8-hydroquinoline) aluminum (Al q3) /rubrene/poly(ethylene glycol) dimethyl ether (PEGDE)/Al interfaces was studied using in situ ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). The UPS and XPS spectra allowed us to evaluate the complete energy level diagrams and to analyze the chemical interactions at the interfaces. When a PEGDE/rubrene double layer was inserted between Al and Al q3, the electron injection barrier height was greatly reduced compared to the interface without PEGDE/rubrene or with a single insertion layer of either PEGDE or rubrene.

Original languageEnglish
Article number152107
JournalApplied Physics Letters
Volume91
Issue number15
DOIs
Publication statusPublished - 2007 Oct 18

Fingerprint

glycols
ethers
ethylene
photoelectron spectroscopy
injection
oxides
ultraviolet spectroscopy
x ray spectroscopy
electrons
insertion
energy levels
diagrams
electronic structure
aluminum
interactions

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

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title = "The origin of electron injection improvement in organic light-emitting devices with an organic oxide/rubrene electron injection layer",
abstract = "The electronic structure of tris(8-hydroquinoline) aluminum (Al q3) /rubrene/poly(ethylene glycol) dimethyl ether (PEGDE)/Al interfaces was studied using in situ ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). The UPS and XPS spectra allowed us to evaluate the complete energy level diagrams and to analyze the chemical interactions at the interfaces. When a PEGDE/rubrene double layer was inserted between Al and Al q3, the electron injection barrier height was greatly reduced compared to the interface without PEGDE/rubrene or with a single insertion layer of either PEGDE or rubrene.",
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The origin of electron injection improvement in organic light-emitting devices with an organic oxide/rubrene electron injection layer. / Cho, Kwanghee; Cho, Sang Wan; Whang, Chung Nam; Jeong, Kwangho; Kang, Seong Jun; Yi, Yeonjin.

In: Applied Physics Letters, Vol. 91, No. 15, 152107, 18.10.2007.

Research output: Contribution to journalArticle

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AU - Cho, Kwanghee

AU - Cho, Sang Wan

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AU - Kang, Seong Jun

AU - Yi, Yeonjin

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AB - The electronic structure of tris(8-hydroquinoline) aluminum (Al q3) /rubrene/poly(ethylene glycol) dimethyl ether (PEGDE)/Al interfaces was studied using in situ ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). The UPS and XPS spectra allowed us to evaluate the complete energy level diagrams and to analyze the chemical interactions at the interfaces. When a PEGDE/rubrene double layer was inserted between Al and Al q3, the electron injection barrier height was greatly reduced compared to the interface without PEGDE/rubrene or with a single insertion layer of either PEGDE or rubrene.

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