The origin of electron injection improvement in organic light-emitting devices with an organic oxide/rubrene electron injection layer

Kwanghee Cho; Sang Wan Cho; Chung Nam Whang; Kwangho Jeong; Seong Jun Kang; Yeonjin Yi

doi:10.1063/1.2798588

The origin of electron injection improvement in organic light-emitting devices with an organic oxide/rubrene electron injection layer

Kwanghee Cho, Sang Wan Cho, Chung Nam Whang, Kwangho Jeong, Seong Jun Kang, Yeonjin Yi

Research output: Contribution to journal › Article

3 Citations (Scopus)

Abstract

The electronic structure of tris(8-hydroquinoline) aluminum (Al q3) /rubrene/poly(ethylene glycol) dimethyl ether (PEGDE)/Al interfaces was studied using in situ ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). The UPS and XPS spectra allowed us to evaluate the complete energy level diagrams and to analyze the chemical interactions at the interfaces. When a PEGDE/rubrene double layer was inserted between Al and Al q3, the electron injection barrier height was greatly reduced compared to the interface without PEGDE/rubrene or with a single insertion layer of either PEGDE or rubrene.

Original language	English
Article number	152107
Journal	Applied Physics Letters
Volume	91
Issue number	15
DOIs	https://doi.org/10.1063/1.2798588
Publication status	Published - 2007 Oct 18

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All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

Cite this

Cho, K., Cho, S. W., Whang, C. N., Jeong, K., Kang, S. J., & Yi, Y. (2007). The origin of electron injection improvement in organic light-emitting devices with an organic oxide/rubrene electron injection layer. Applied Physics Letters, 91(15), [152107]. https://doi.org/10.1063/1.2798588

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10.1063/1.2798588