The reactant depletion effect on chemically vapor deposited SiC films with pressure and gas ambient

Han Su Kim, Doo Jin Choi

Research output: Contribution to journalArticle

28 Citations (Scopus)

Abstract

Polycrystalline β-silicon carbide (SiC) films were chemically vapor-deposited onto graphite substrate using MTS(CH3SiCl3) as precursor and Ar or H2 dilution gas, at temperatures ranging from 1273 to 1573 K and total pressures from 1.3 to 10.0 kPa. We investigated the effect of reactant depletion, which usually occurs in the horizontal hot wall reactor, on the characteristics of SiC films with total pressure and gas ambient. Crystalline phases and preferred orientations are determined by X-ray diffraction (XRD) and surface morphology is identified with scanning electron microscopy (SEM). The effect of reactant depletion was correlated with the decrease of the deposition rate in a gas flow direction. Its effect becomes larger with increasing deposition temperature and total pressure, but remarkably diminished when Ar was used as a dilution gas in place of H2. With the increase of reactant depletion, preferred orientation of SiC films changes from [220] to [111] and surface morphologies of those also develop into the four-fold symmetry faceted structure in a gas flow direction. With the diminution of reactant depletion, SiC films have uniform preferred orientation of [111] and surface morphologies at all deposition positions.

Original languageEnglish
Pages (from-to)195-201
Number of pages7
JournalThin Solid Films
Volume312
Issue number1-2
DOIs
Publication statusPublished - 1998 Jan 14

Fingerprint

Silicon carbide
silicon carbides
depletion
Gases
Vapors
vapors
Surface morphology
gases
Dilution
gas flow
Flow of gases
dilution
Graphite
Deposition rates
Polysilicon
Crystal orientation
graphite
reactors
Crystalline materials
X ray diffraction

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this

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abstract = "Polycrystalline β-silicon carbide (SiC) films were chemically vapor-deposited onto graphite substrate using MTS(CH3SiCl3) as precursor and Ar or H2 dilution gas, at temperatures ranging from 1273 to 1573 K and total pressures from 1.3 to 10.0 kPa. We investigated the effect of reactant depletion, which usually occurs in the horizontal hot wall reactor, on the characteristics of SiC films with total pressure and gas ambient. Crystalline phases and preferred orientations are determined by X-ray diffraction (XRD) and surface morphology is identified with scanning electron microscopy (SEM). The effect of reactant depletion was correlated with the decrease of the deposition rate in a gas flow direction. Its effect becomes larger with increasing deposition temperature and total pressure, but remarkably diminished when Ar was used as a dilution gas in place of H2. With the increase of reactant depletion, preferred orientation of SiC films changes from [220] to [111] and surface morphologies of those also develop into the four-fold symmetry faceted structure in a gas flow direction. With the diminution of reactant depletion, SiC films have uniform preferred orientation of [111] and surface morphologies at all deposition positions.",
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The reactant depletion effect on chemically vapor deposited SiC films with pressure and gas ambient. / Kim, Han Su; Choi, Doo Jin.

In: Thin Solid Films, Vol. 312, No. 1-2, 14.01.1998, p. 195-201.

Research output: Contribution to journalArticle

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AB - Polycrystalline β-silicon carbide (SiC) films were chemically vapor-deposited onto graphite substrate using MTS(CH3SiCl3) as precursor and Ar or H2 dilution gas, at temperatures ranging from 1273 to 1573 K and total pressures from 1.3 to 10.0 kPa. We investigated the effect of reactant depletion, which usually occurs in the horizontal hot wall reactor, on the characteristics of SiC films with total pressure and gas ambient. Crystalline phases and preferred orientations are determined by X-ray diffraction (XRD) and surface morphology is identified with scanning electron microscopy (SEM). The effect of reactant depletion was correlated with the decrease of the deposition rate in a gas flow direction. Its effect becomes larger with increasing deposition temperature and total pressure, but remarkably diminished when Ar was used as a dilution gas in place of H2. With the increase of reactant depletion, preferred orientation of SiC films changes from [220] to [111] and surface morphologies of those also develop into the four-fold symmetry faceted structure in a gas flow direction. With the diminution of reactant depletion, SiC films have uniform preferred orientation of [111] and surface morphologies at all deposition positions.

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