Abstract
We investigate the amplitude and phase of fluorescence self-interference fields and their implication for new imaging strategies. Wide-field (y > 1mm, z > 100μm) high resolution (micron-scale) imaging and phase-contrast profiling with nanometer sensitivity are demonstrated.
| Original language | English |
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| Title of host publication | Conference on Lasers and Electro-Optics, 2007, CLEO 2007 |
| DOIs | |
| Publication status | Published - 2007 |
| Event | Conference on Lasers and Electro-Optics, 2007, CLEO 2007 - Baltimore, MD, United States Duration: 2007 May 6 → 2007 May 11 |
Publication series
| Name | Conference on Lasers and Electro-Optics, 2007, CLEO 2007 |
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Other
| Other | Conference on Lasers and Electro-Optics, 2007, CLEO 2007 |
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| Country | United States |
| City | Baltimore, MD |
| Period | 07/5/6 → 07/5/11 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
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Cite this
Bilenca, A., Joo, C., Ozcan, A., De Boer, J. F., Bouma, B., & Tearney, G. (2007). The role of amplitude and phase in fluorescence coherence imaging: From wide field to nanometer depth profiling. In Conference on Lasers and Electro-Optics, 2007, CLEO 2007 [4453093] (Conference on Lasers and Electro-Optics, 2007, CLEO 2007). https://doi.org/10.1109/CLEO.2007.4453093