The role of amplitude and phase in fluorescence coherence imaging: From wide field to nanometer depth profiling

A. Bilenca; C. Joo; A. Ozcan; J. F. De Boer; B. Bouma; G. Tearney

doi:10.1109/CLEO.2007.4453093

The role of amplitude and phase in fluorescence coherence imaging: From wide field to nanometer depth profiling

A. Bilenca, C. Joo, A. Ozcan, J. F. De Boer, B. Bouma, G. Tearney

Department of Mechanical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

We investigate the amplitude and phase of fluorescence self-interference fields and their implication for new imaging strategies. Wide-field (y > 1mm, z > 100μm) high resolution (micron-scale) imaging and phase-contrast profiling with nanometer sensitivity are demonstrated.

Original language	English
Title of host publication	Conference on Lasers and Electro-Optics, 2007, CLEO 2007
DOIs	https://doi.org/10.1109/CLEO.2007.4453093
Publication status	Published - 2007
Event	Conference on Lasers and Electro-Optics, 2007, CLEO 2007 - Baltimore, MD, United States Duration: 2007 May 6 → 2007 May 11

Publication series

Name	Conference on Lasers and Electro-Optics, 2007, CLEO 2007

Other

Other	Conference on Lasers and Electro-Optics, 2007, CLEO 2007
Country/Territory	United States
City	Baltimore, MD
Period	07/5/6 → 07/5/11

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials

Access to Document

10.1109/CLEO.2007.4453093

Cite this

@inproceedings{490774774f334aaf9cc6070a68f7b59e,

title = "The role of amplitude and phase in fluorescence coherence imaging: From wide field to nanometer depth profiling",

abstract = "We investigate the amplitude and phase of fluorescence self-interference fields and their implication for new imaging strategies. Wide-field (y > 1mm, z > 100μm) high resolution (micron-scale) imaging and phase-contrast profiling with nanometer sensitivity are demonstrated.",

author = "A. Bilenca and C. Joo and A. Ozcan and {De Boer}, {J. F.} and B. Bouma and G. Tearney",

year = "2007",

doi = "10.1109/CLEO.2007.4453093",

language = "English",

isbn = "9781557528346",

series = "Conference on Lasers and Electro-Optics, 2007, CLEO 2007",

booktitle = "Conference on Lasers and Electro-Optics, 2007, CLEO 2007",

note = "Conference on Lasers and Electro-Optics, 2007, CLEO 2007 ; Conference date: 06-05-2007 Through 11-05-2007",

}

Bilenca, A, Joo, C, Ozcan, A, De Boer, JF, Bouma, B & Tearney, G 2007, The role of amplitude and phase in fluorescence coherence imaging: From wide field to nanometer depth profiling. in Conference on Lasers and Electro-Optics, 2007, CLEO 2007., 4453093, Conference on Lasers and Electro-Optics, 2007, CLEO 2007, Conference on Lasers and Electro-Optics, 2007, CLEO 2007, Baltimore, MD, United States, 07/5/6. https://doi.org/10.1109/CLEO.2007.4453093

The role of amplitude and phase in fluorescence coherence imaging : From wide field to nanometer depth profiling. / Bilenca, A.; Joo, C.; Ozcan, A.; De Boer, J. F.; Bouma, B.; Tearney, G.

Conference on Lasers and Electro-Optics, 2007, CLEO 2007. 2007. 4453093 (Conference on Lasers and Electro-Optics, 2007, CLEO 2007).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - The role of amplitude and phase in fluorescence coherence imaging

T2 - Conference on Lasers and Electro-Optics, 2007, CLEO 2007

AU - Bilenca, A.

AU - Joo, C.

AU - Ozcan, A.

AU - De Boer, J. F.

AU - Bouma, B.

AU - Tearney, G.

PY - 2007

Y1 - 2007

N2 - We investigate the amplitude and phase of fluorescence self-interference fields and their implication for new imaging strategies. Wide-field (y > 1mm, z > 100μm) high resolution (micron-scale) imaging and phase-contrast profiling with nanometer sensitivity are demonstrated.

AB - We investigate the amplitude and phase of fluorescence self-interference fields and their implication for new imaging strategies. Wide-field (y > 1mm, z > 100μm) high resolution (micron-scale) imaging and phase-contrast profiling with nanometer sensitivity are demonstrated.

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DO - 10.1109/CLEO.2007.4453093

M3 - Conference contribution

AN - SCOPUS:82955178606

SN - 9781557528346

T3 - Conference on Lasers and Electro-Optics, 2007, CLEO 2007

BT - Conference on Lasers and Electro-Optics, 2007, CLEO 2007

Y2 - 6 May 2007 through 11 May 2007

ER -

The role of amplitude and phase in fluorescence coherence imaging: From wide field to nanometer depth profiling

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