The role of amplitude and phase in fluorescence coherence imaging: From wide field to nanometer depth profiling

A. Bilenca, C. Joo, A. Ozcan, J. F. De Boer, B. Bouma, G. Tearney

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We investigate the amplitude and phase of fluorescence self-interference fields and their implication for new imaging strategies. Wide-field (y > 1mm, z > 100μm) high resolution (micron-scale) imaging and phase-contrast profiling with nanometer sensitivity are demonstrated.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics, 2007, CLEO 2007
DOIs
Publication statusPublished - 2007
EventConference on Lasers and Electro-Optics, 2007, CLEO 2007 - Baltimore, MD, United States
Duration: 2007 May 62007 May 11

Publication series

NameConference on Lasers and Electro-Optics, 2007, CLEO 2007

Other

OtherConference on Lasers and Electro-Optics, 2007, CLEO 2007
CountryUnited States
CityBaltimore, MD
Period07/5/607/5/11

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials

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    Bilenca, A., Joo, C., Ozcan, A., De Boer, J. F., Bouma, B., & Tearney, G. (2007). The role of amplitude and phase in fluorescence coherence imaging: From wide field to nanometer depth profiling. In Conference on Lasers and Electro-Optics, 2007, CLEO 2007 [4453093] (Conference on Lasers and Electro-Optics, 2007, CLEO 2007). https://doi.org/10.1109/CLEO.2007.4453093