Abstract
We investigate the amplitude and phase of fluorescence self-interference fields and their implication for new imaging strategies. Wide-field (y > 1mm, z > 100μm) high resolution (micron-scale) imaging and phase-contrast profiling with nanometer sensitivity are demonstrated.
| Original language | English |
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| Title of host publication | Conference on Lasers and Electro-Optics, 2007, CLEO 2007 |
| DOIs | |
| Publication status | Published - 2007 Dec 1 |
| Event | Conference on Lasers and Electro-Optics, 2007, CLEO 2007 - Baltimore, MD, United States Duration: 2007 May 6 → 2007 May 11 |
Publication series
| Name | Conference on Lasers and Electro-Optics, 2007, CLEO 2007 |
|---|
Other
| Other | Conference on Lasers and Electro-Optics, 2007, CLEO 2007 |
|---|---|
| Country | United States |
| City | Baltimore, MD |
| Period | 07/5/6 → 07/5/11 |
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All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
Cite this
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The role of amplitude and phase in fluorescence coherence imaging : From wide field to nanometer depth profiling. / Bilenca, A.; Joo, C.; Ozcan, A.; De Boer, J. F.; Bouma, B.; Tearney, G.
Conference on Lasers and Electro-Optics, 2007, CLEO 2007. 2007. 4453093 (Conference on Lasers and Electro-Optics, 2007, CLEO 2007).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - The role of amplitude and phase in fluorescence coherence imaging
T2 - From wide field to nanometer depth profiling
AU - Bilenca, A.
AU - Joo, C.
AU - Ozcan, A.
AU - De Boer, J. F.
AU - Bouma, B.
AU - Tearney, G.
PY - 2007/12/1
Y1 - 2007/12/1
N2 - We investigate the amplitude and phase of fluorescence self-interference fields and their implication for new imaging strategies. Wide-field (y > 1mm, z > 100μm) high resolution (micron-scale) imaging and phase-contrast profiling with nanometer sensitivity are demonstrated.
AB - We investigate the amplitude and phase of fluorescence self-interference fields and their implication for new imaging strategies. Wide-field (y > 1mm, z > 100μm) high resolution (micron-scale) imaging and phase-contrast profiling with nanometer sensitivity are demonstrated.
UR - http://www.scopus.com/inward/record.url?scp=82955178606&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=82955178606&partnerID=8YFLogxK
U2 - 10.1109/CLEO.2007.4453093
DO - 10.1109/CLEO.2007.4453093
M3 - Conference contribution
AN - SCOPUS:82955178606
SN - 9781557528346
T3 - Conference on Lasers and Electro-Optics, 2007, CLEO 2007
BT - Conference on Lasers and Electro-Optics, 2007, CLEO 2007
ER -