The role of amplitude and phase in fluorescence coherence imaging: From wide field to nanometer depth profiling

A. Bilenca, C. Joo, A. Ozcan, J. F. De Boer, B. Bouma, G. Tearney

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We investigate the amplitude and phase of fluorescence self-interference fields and their implication for new imaging strategies. Wide-field (y > 1mm, z > 100μm) high resolution (micron-scale) imaging and phase-contrast profiling with nanometer sensitivity are demonstrated.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics, 2007, CLEO 2007
DOIs
Publication statusPublished - 2007 Dec 1
EventConference on Lasers and Electro-Optics, 2007, CLEO 2007 - Baltimore, MD, United States
Duration: 2007 May 62007 May 11

Publication series

NameConference on Lasers and Electro-Optics, 2007, CLEO 2007

Other

OtherConference on Lasers and Electro-Optics, 2007, CLEO 2007
CountryUnited States
CityBaltimore, MD
Period07/5/607/5/11

Fingerprint

Depth profiling
Fluorescence
Imaging techniques

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials

Cite this

Bilenca, A., Joo, C., Ozcan, A., De Boer, J. F., Bouma, B., & Tearney, G. (2007). The role of amplitude and phase in fluorescence coherence imaging: From wide field to nanometer depth profiling. In Conference on Lasers and Electro-Optics, 2007, CLEO 2007 [4453093] (Conference on Lasers and Electro-Optics, 2007, CLEO 2007). https://doi.org/10.1109/CLEO.2007.4453093
Bilenca, A. ; Joo, C. ; Ozcan, A. ; De Boer, J. F. ; Bouma, B. ; Tearney, G. / The role of amplitude and phase in fluorescence coherence imaging : From wide field to nanometer depth profiling. Conference on Lasers and Electro-Optics, 2007, CLEO 2007. 2007. (Conference on Lasers and Electro-Optics, 2007, CLEO 2007).
@inproceedings{490774774f334aaf9cc6070a68f7b59e,
title = "The role of amplitude and phase in fluorescence coherence imaging: From wide field to nanometer depth profiling",
abstract = "We investigate the amplitude and phase of fluorescence self-interference fields and their implication for new imaging strategies. Wide-field (y > 1mm, z > 100μm) high resolution (micron-scale) imaging and phase-contrast profiling with nanometer sensitivity are demonstrated.",
author = "A. Bilenca and C. Joo and A. Ozcan and {De Boer}, {J. F.} and B. Bouma and G. Tearney",
year = "2007",
month = "12",
day = "1",
doi = "10.1109/CLEO.2007.4453093",
language = "English",
isbn = "9781557528346",
series = "Conference on Lasers and Electro-Optics, 2007, CLEO 2007",
booktitle = "Conference on Lasers and Electro-Optics, 2007, CLEO 2007",

}

Bilenca, A, Joo, C, Ozcan, A, De Boer, JF, Bouma, B & Tearney, G 2007, The role of amplitude and phase in fluorescence coherence imaging: From wide field to nanometer depth profiling. in Conference on Lasers and Electro-Optics, 2007, CLEO 2007., 4453093, Conference on Lasers and Electro-Optics, 2007, CLEO 2007, Conference on Lasers and Electro-Optics, 2007, CLEO 2007, Baltimore, MD, United States, 07/5/6. https://doi.org/10.1109/CLEO.2007.4453093

The role of amplitude and phase in fluorescence coherence imaging : From wide field to nanometer depth profiling. / Bilenca, A.; Joo, C.; Ozcan, A.; De Boer, J. F.; Bouma, B.; Tearney, G.

Conference on Lasers and Electro-Optics, 2007, CLEO 2007. 2007. 4453093 (Conference on Lasers and Electro-Optics, 2007, CLEO 2007).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - The role of amplitude and phase in fluorescence coherence imaging

T2 - From wide field to nanometer depth profiling

AU - Bilenca, A.

AU - Joo, C.

AU - Ozcan, A.

AU - De Boer, J. F.

AU - Bouma, B.

AU - Tearney, G.

PY - 2007/12/1

Y1 - 2007/12/1

N2 - We investigate the amplitude and phase of fluorescence self-interference fields and their implication for new imaging strategies. Wide-field (y > 1mm, z > 100μm) high resolution (micron-scale) imaging and phase-contrast profiling with nanometer sensitivity are demonstrated.

AB - We investigate the amplitude and phase of fluorescence self-interference fields and their implication for new imaging strategies. Wide-field (y > 1mm, z > 100μm) high resolution (micron-scale) imaging and phase-contrast profiling with nanometer sensitivity are demonstrated.

UR - http://www.scopus.com/inward/record.url?scp=82955178606&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=82955178606&partnerID=8YFLogxK

U2 - 10.1109/CLEO.2007.4453093

DO - 10.1109/CLEO.2007.4453093

M3 - Conference contribution

AN - SCOPUS:82955178606

SN - 9781557528346

T3 - Conference on Lasers and Electro-Optics, 2007, CLEO 2007

BT - Conference on Lasers and Electro-Optics, 2007, CLEO 2007

ER -

Bilenca A, Joo C, Ozcan A, De Boer JF, Bouma B, Tearney G. The role of amplitude and phase in fluorescence coherence imaging: From wide field to nanometer depth profiling. In Conference on Lasers and Electro-Optics, 2007, CLEO 2007. 2007. 4453093. (Conference on Lasers and Electro-Optics, 2007, CLEO 2007). https://doi.org/10.1109/CLEO.2007.4453093