The Structural Origin of Electron Injection Enhancements with Fulleropyrrolidine Interlayers

Hyunbok Lee, John C. Stephenson, Lee J. Richter, Christopher R. McNeill, Eliot Gann, Lars Thomsen, Soohyung Park, Junkyeong Jeong, Yeonjin Yi, Dean M. DeLongchamp, Zachariah A. Page, Egle Puodziukynaite, Todd Emrick, Alejandro L. Briseno

Research output: Contribution to journalArticle

6 Citations (Scopus)
Original languageEnglish
Article number1500852
JournalAdvanced Materials Interfaces
Volume3
Issue number10
DOIs
Publication statusPublished - 2016 May 23

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Electron injection
Electronic structure
Amines

All Science Journal Classification (ASJC) codes

  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Lee, H., Stephenson, J. C., Richter, L. J., McNeill, C. R., Gann, E., Thomsen, L., ... Briseno, A. L. (2016). The Structural Origin of Electron Injection Enhancements with Fulleropyrrolidine Interlayers. Advanced Materials Interfaces, 3(10), [1500852]. https://doi.org/10.1002/admi.201500852
Lee, Hyunbok ; Stephenson, John C. ; Richter, Lee J. ; McNeill, Christopher R. ; Gann, Eliot ; Thomsen, Lars ; Park, Soohyung ; Jeong, Junkyeong ; Yi, Yeonjin ; DeLongchamp, Dean M. ; Page, Zachariah A. ; Puodziukynaite, Egle ; Emrick, Todd ; Briseno, Alejandro L. / The Structural Origin of Electron Injection Enhancements with Fulleropyrrolidine Interlayers. In: Advanced Materials Interfaces. 2016 ; Vol. 3, No. 10.
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author = "Hyunbok Lee and Stephenson, {John C.} and Richter, {Lee J.} and McNeill, {Christopher R.} and Eliot Gann and Lars Thomsen and Soohyung Park and Junkyeong Jeong and Yeonjin Yi and DeLongchamp, {Dean M.} and Page, {Zachariah A.} and Egle Puodziukynaite and Todd Emrick and Briseno, {Alejandro L.}",
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Lee, H, Stephenson, JC, Richter, LJ, McNeill, CR, Gann, E, Thomsen, L, Park, S, Jeong, J, Yi, Y, DeLongchamp, DM, Page, ZA, Puodziukynaite, E, Emrick, T & Briseno, AL 2016, 'The Structural Origin of Electron Injection Enhancements with Fulleropyrrolidine Interlayers', Advanced Materials Interfaces, vol. 3, no. 10, 1500852. https://doi.org/10.1002/admi.201500852

The Structural Origin of Electron Injection Enhancements with Fulleropyrrolidine Interlayers. / Lee, Hyunbok; Stephenson, John C.; Richter, Lee J.; McNeill, Christopher R.; Gann, Eliot; Thomsen, Lars; Park, Soohyung; Jeong, Junkyeong; Yi, Yeonjin; DeLongchamp, Dean M.; Page, Zachariah A.; Puodziukynaite, Egle; Emrick, Todd; Briseno, Alejandro L.

In: Advanced Materials Interfaces, Vol. 3, No. 10, 1500852, 23.05.2016.

Research output: Contribution to journalArticle

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T1 - The Structural Origin of Electron Injection Enhancements with Fulleropyrrolidine Interlayers

AU - Lee, Hyunbok

AU - Stephenson, John C.

AU - Richter, Lee J.

AU - McNeill, Christopher R.

AU - Gann, Eliot

AU - Thomsen, Lars

AU - Park, Soohyung

AU - Jeong, Junkyeong

AU - Yi, Yeonjin

AU - DeLongchamp, Dean M.

AU - Page, Zachariah A.

AU - Puodziukynaite, Egle

AU - Emrick, Todd

AU - Briseno, Alejandro L.

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U2 - 10.1002/admi.201500852

DO - 10.1002/admi.201500852

M3 - Article

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JO - Advanced Materials Interfaces

JF - Advanced Materials Interfaces

SN - 2196-7350

IS - 10

M1 - 1500852

ER -