The transient ytterbium doped fiber amplifier phase noise measurement using heterodyne detection

Sungrae Lee, Kyunghwan Oh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We have demonstrated phase noise measurements of ytterbium doped fiber amplifier on transient pumping process based on active phase locking using optical heterodyne detection from all-fiber Mach-Zehnder interferometer. The intrinsic and extrinsic factors during amplifying process worsen coherence and lead to randomly fluctuated phase error. Root mean square, power spectral density, and phase drift velocity were employed as quantitative values for evaluating phase error. The results implied that main frequency bandwidth of phase noise was characterized by type of pumping process, output power, and fiber amplifier components. This platform can be utilized to evaluate phase noise error directly under the different amplifier configuration and condition, and it helps find better condition of amplifier for assuring rigid beam combining performance henceforth.

Original languageEnglish
Title of host publication2015 Opto-Electronics and Communications Conference, OECC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467379441
DOIs
Publication statusPublished - 2015 Nov 30
EventOpto-Electronics and Communications Conference, OECC 2015 - Shanghai, China
Duration: 2015 Jun 282015 Jul 2

Publication series

Name2015 Opto-Electronics and Communications Conference, OECC 2015

Other

OtherOpto-Electronics and Communications Conference, OECC 2015
CountryChina
CityShanghai
Period15/6/2815/7/2

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All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Electrical and Electronic Engineering

Cite this

Lee, S., & Oh, K. (2015). The transient ytterbium doped fiber amplifier phase noise measurement using heterodyne detection. In 2015 Opto-Electronics and Communications Conference, OECC 2015 [7340139] (2015 Opto-Electronics and Communications Conference, OECC 2015). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/OECC.2015.7340139