The work function of doped polyaniline nanoparticles observed by Kelvin probe force microscopy

Jinsung Park, Doyeon Bang, Kuewhan Jang, Seungjoo Haam, Jaemoon Yang, Sungsoo Na

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

The work function of polyaniline nanoparticles in the emeraldine base state was determined by Kelvin probe force microscopy to be ∼270 meV higher than that of similar nanoparticles in the emeraldine salt state. Normal tapping mode atomic force microscopy could not be used to distinguish between the particles due to their similar morphologies and sizes. Moreover, other potential measurement systems, such as using zeta potentials, were not suitable for the measurement of surface charges of doped nanoparticles due to their encapsulation by interfering chemical groups. Kelvin probe force microscopy can be used to overcome these limitations and unambiguously distinguish between the bare and doped polyaniline nanoparticles.

Original languageEnglish
Article number365705
JournalNanotechnology
Volume23
Issue number36
DOIs
Publication statusPublished - 2012 Sep 14

Fingerprint

Polyaniline
Microscopic examination
Nanoparticles
Zeta potential
Surface charge
Encapsulation
Atomic force microscopy
Salts
polyaniline

All Science Journal Classification (ASJC) codes

  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering
  • Electrical and Electronic Engineering

Cite this

Park, Jinsung ; Bang, Doyeon ; Jang, Kuewhan ; Haam, Seungjoo ; Yang, Jaemoon ; Na, Sungsoo. / The work function of doped polyaniline nanoparticles observed by Kelvin probe force microscopy. In: Nanotechnology. 2012 ; Vol. 23, No. 36.
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The work function of doped polyaniline nanoparticles observed by Kelvin probe force microscopy. / Park, Jinsung; Bang, Doyeon; Jang, Kuewhan; Haam, Seungjoo; Yang, Jaemoon; Na, Sungsoo.

In: Nanotechnology, Vol. 23, No. 36, 365705, 14.09.2012.

Research output: Contribution to journalArticle

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