Thermal modeling of 7 nm node bulk fin-shaped field-effect transistors for device structure-aware design

Chuntaek Park, Ilgu Yun

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Thermal modeling of 7 nm node bulk fin-shaped field-effect transistors for device structure-aware design'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy

Chemistry