TY - GEN
T1 - Thermal System Identification (TSI)
T2 - 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium, SEMI-THERM 2012
AU - Cho, Minki
AU - Song, William
AU - Yalamanchili, Sudhakar
AU - Mukhopadhyay, Saibal
PY - 2012
Y1 - 2012
N2 - This paper presents a methodology for post-silicon thermal prediction to predict the transient thermal field a multicore package for various workload considering chip-to-chip variations in electrical and thermal properties. We use time-frequency duality to represent thermal system in frequency domain as a low-pass filter augmented with a positive feedback path for leakage-temperature interaction. This thermal system is identified through power/thermal measurements on a packaged IC and is used for post-silicon thermal prediction. The effectiveness of the proposed effort is presented considering a 64 core processor in predictive 22nm node and SPEC2006 benchmark applications.
AB - This paper presents a methodology for post-silicon thermal prediction to predict the transient thermal field a multicore package for various workload considering chip-to-chip variations in electrical and thermal properties. We use time-frequency duality to represent thermal system in frequency domain as a low-pass filter augmented with a positive feedback path for leakage-temperature interaction. This thermal system is identified through power/thermal measurements on a packaged IC and is used for post-silicon thermal prediction. The effectiveness of the proposed effort is presented considering a 64 core processor in predictive 22nm node and SPEC2006 benchmark applications.
UR - http://www.scopus.com/inward/record.url?scp=84861121456&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84861121456&partnerID=8YFLogxK
U2 - 10.1109/STHERM.2012.6188836
DO - 10.1109/STHERM.2012.6188836
M3 - Conference contribution
AN - SCOPUS:84861121456
SN - 9781467311113
T3 - Annual IEEE Semiconductor Thermal Measurement and Management Symposium
SP - 118
EP - 124
BT - 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium, SEMI-THERM 2012
Y2 - 18 March 2012 through 22 March 2012
ER -