Thickness-dependent fracture behaviour of flexible ZnO :Al thin films

Bhaskar Chandra Mohanty, Hong Rak Choi, Yong Muk Choi, Yong Soo Cho

Research output: Contribution to journalArticlepeer-review

38 Citations (Scopus)


The effects of thickness on flexibility and crack initiation in ZnO :Al thin films sputter-deposited on polyethersulfone substrates have been investigated. With an increase in thickness, root-mean-square roughness and average crystallite size increase linearly. It is found that the higher the thickness, the lower is the strain required to initiate cracks in the film. The thinnest film (∼240 nm) exhibits a crack-initiating critical strain of 0.96% and a saturated crack density of 0.10μm-1. A critical energy release rate of 68.5 Jm-2 and a mode I fracture toughness of 3.2MPam0.5 are estimated for the films. These parameters are found to exhibit a linear dependence on film thickness.

Original languageEnglish
Article number25401
JournalJournal of Physics D: Applied Physics
Issue number2
Publication statusPublished - 2011 Jan 19

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Acoustics and Ultrasonics
  • Surfaces, Coatings and Films


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