Thickness dependent properties of ZnSe on (100) GaAs grown by atomic layer epitaxy

C. D. Lee, B. K. Kim, J. W. Kim, H. L. Park, C. H. Chung, S. K. Chang, J. I. Lee, S. K. Noh

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Thickness dependent properties of ZnSe on (100) GaAs grown by atomic layer epitaxy'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds

Physics & Astronomy