Thin-film-based field penetration engineering for surface plasmon resonance biosensing

Soon Joon Yoon, Donghyun Kim

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

Penetration depth defines the measurable range in evanescent-wave-based sensing techniques such as surface plasmon resonance (SPR). We investigate penetration depth variation implemented with dielectric layers in a SPR sensing structure. The results show that the penetration depth can be controlled to increase or decrease depending on a specific configuration. Effective medium theory was introduced to describe the field penetration in dielectric multilayer designs. Comparison was made with the field penetration of a localized SPR structure based on periodic nanowires. The penetration depth variation in response to environmental changes was also explored.

Original languageEnglish
Pages (from-to)2543-2549
Number of pages7
JournalJournal of the Optical Society of America A: Optics and Image Science, and Vision
Volume24
Issue number9
DOIs
Publication statusPublished - 2007 Jan 1

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Surface plasmon resonance
surface plasmon resonance
penetration
engineering
Thin films
thin films
Nanowires
Multilayers
evanescent waves
nanowires
configurations

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Computer Vision and Pattern Recognition

Cite this

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