Thin film electronic properties of ternary topological insulator

Jiwon Chang, Leonard F. Register, Sanjay K. Banerjee, Bhagawan Sahu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Using an ab initio density functional theory (DFT), we study thin film electronic properties of topological insulators (TIs) based on ternary compounds of Tl (thallium) and Bi (bismuth). We consider TlBiX2 (X=Se, Te) and Bi2X2Y (X, Y=Se, Te) compounds. Here we discuss the nature of surface states, their locations in the Brillouin Zone (BZ) and their interactions within the bulk region. Our calculations suggest a critical film thickness to maintain the Dirac cone which is smaller than that in binary Bi-based compounds. Atomic relaxations are found to affect the Dirac cone in some of these compounds. We discuss the penetration depth of surface states into the bulk region.

Original languageEnglish
Title of host publicationTopological Insulator Materials
Pages1-6
Number of pages6
DOIs
Publication statusPublished - 2011
Event2011 MRS Fall Meeting - Boston, MA, United States
Duration: 2011 Nov 282011 Dec 2

Publication series

NameMaterials Research Society Symposium Proceedings
Volume1393
ISSN (Print)0272-9172

Conference

Conference2011 MRS Fall Meeting
CountryUnited States
CityBoston, MA
Period11/11/2811/12/2

Bibliographical note

Funding Information:
The authors acknowledge financial support from the Nanoelectronics Research Initiative supported Southwest Academy of Nanoelectronics (NRI-SWAN) center. We thank the Texas advanced computing center (TACC) for computational support(TG-DMR080016N).

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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