Threshold-switching (TS) and selector performances of Si-As-Te thin films for crossbar resistive memory were studied. Composition of the film was the major factor determining the emergence of TS. On-state conduction was found to occur at localized regions. The change of threshold voltage and off-state current by varying composition was observed, which were explained by the change in the concentration of defects and generation efficiency of carriers. The serially connected TiO 2 unipolar switching memory and Si-As-Te threshold switch showed the resistance switching of the memory layer with the leakage current lowered by ∼120 times at 0.5 V.
|Journal||Applied Physics Letters|
|Publication status||Published - 2012 Mar 19|
Bibliographical noteFunding Information:
This work was supported by R&D Program (#:10039191), and National Research Program for Nano Semiconductor Apparatus Development sponsored by the Korean Ministry of Knowledge and Economy.
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)