Tightly focused epimicroscope technique for submicrometer-resolved highly sensitive refractive index measurement of an optical waveguide

Youngchun Youk; Dug Young Kim

doi:10.1364/AO.46.002949

Tightly focused epimicroscope technique for submicrometer-resolved highly sensitive refractive index measurement of an optical waveguide

Youngchun Youk, Dug Young Kim

Department of Physics

Research output: Contribution to journal › Article › peer-review

8 Citations (Scopus)

Abstract

We introduce a very sensitive new configuration, to the best of our knowledge, in an optical microscope system that utilizes two detectors: one is to measure the power of a low reflected signal from a sample, and the other is only to monitor the confocal geometry of the system. With this new configuration, we could effectively remove measurement noise associated with small perturbation in measurement conditions such as surface curvature, tilt, and vibration in a microscope system. We have obtained a high-resolution relative index precision of 9 × 10^-5 by employing this novel technique with two detectors.

Original language	English
Pages (from-to)	2949-2953
Number of pages	5
Journal	Applied Optics
Volume	46
Issue number	15
DOIs	https://doi.org/10.1364/AO.46.002949
Publication status	Published - 2007 May 20

All Science Journal Classification (ASJC) codes

Atomic and Molecular Physics, and Optics
Engineering (miscellaneous)
Electrical and Electronic Engineering

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10.1364/AO.46.002949

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Tightly focused epimicroscope technique for submicrometer-resolved highly sensitive refractive index measurement of an optical waveguide

Abstract

All Science Journal Classification (ASJC) codes

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