Tightly focused epimicroscope technique for submicrometer-resolved highly sensitive refractive index measurement of an optical waveguide

Youngchun Youk, Dug Young Kim

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

We introduce a very sensitive new configuration, to the best of our knowledge, in an optical microscope system that utilizes two detectors: one is to measure the power of a low reflected signal from a sample, and the other is only to monitor the confocal geometry of the system. With this new configuration, we could effectively remove measurement noise associated with small perturbation in measurement conditions such as surface curvature, tilt, and vibration in a microscope system. We have obtained a high-resolution relative index precision of 9 × 10-5 by employing this novel technique with two detectors.

Original languageEnglish
Pages (from-to)2949-2953
Number of pages5
JournalApplied Optics
Volume46
Issue number15
DOIs
Publication statusPublished - 2007 May 20

Fingerprint

Optical waveguides
optical waveguides
Refractive index
Microscopes
refractivity
Detectors
detectors
noise measurement
configurations
optical microscopes
microscopes
curvature
perturbation
vibration
Geometry
high resolution
geometry

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

Cite this

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Tightly focused epimicroscope technique for submicrometer-resolved highly sensitive refractive index measurement of an optical waveguide. / Youk, Youngchun; Kim, Dug Young.

In: Applied Optics, Vol. 46, No. 15, 20.05.2007, p. 2949-2953.

Research output: Contribution to journalArticle

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