Time-frequency domain reflectometry for smart wiring systems

Yong June Shin, Eun Seok Song, Joo Won Kim, Jin Bae Park, Jong Gwan Yook, Edward J. Powers

Research output: Contribution to journalConference article

6 Citations (Scopus)

Abstract

In this paper, a new high resolution reflectometry scheme, time-frequency domain reflectometry, is proposed to detect and locate a fault in wiring. Traditional reflectometry methods have been achieved in either the time domain or frequency domain only. However, time-frequency domain reflectometry utilizes time and frequency information of a transient signal to detect and locate the fault. The time-frequency domain reflectometry approach described in this paper is characterized by time-frequency reference signal design and post-processing of the reference and reflected signals to detect and locate the fault. Using a computational electromagnetic model of a coaxial cable with a fault, time-frequency domain reflectometry has been demonstrated. Knowledge of time and frequency localized information for the reference and reflected signal gained via time-frequency analysis, allows one to detect the fault and estimate the location accurately.

Original languageEnglish
Pages (from-to)86-95
Number of pages10
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4791
DOIs
Publication statusPublished - 2002 Dec 1
EventAdvanced Signal Processing Algorithms, Architectures, and Implementations XII - Seattle, WA, United States
Duration: 2002 Jul 92002 Jul 11

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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