Time-resolved absolute spectral analysis of IR countermeasure flares and its experimental validation by using an optical emission spectrometer with PbSe array detector

Hyungwoo Lee, Changhoon Oh, Jae W. Hahn

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The absolute spectral radiant exitance of IR signatures from countermeasure flares for mid-IR was experimentally validated by using an optical emission spectrometer. A 256-array PbSe detector was installed to analyze the mid-IR emission spectrum of four IR signatures from countermeasure flares and propellants. We could evaluate the performance of the optical emission spectrometer and verify its usefulness in the field of IR countermeasures. The spectral response of the optical emission spectrometer was calibrated using a directly heated graphite blackbody; in addition, the total uncertainty was analyzed. The absolute amount of emissions of four IR signatures was calculated and compared.

Original languageEnglish
Title of host publicationNext-Generation Spectroscopic Technologies V
DOIs
Publication statusPublished - 2012 Aug 1
EventNext-Generation Spectroscopic Technologies V - Baltimore, MD, United States
Duration: 2012 Apr 232012 Apr 24

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8374
ISSN (Print)0277-786X

Other

OtherNext-Generation Spectroscopic Technologies V
CountryUnited States
CityBaltimore, MD
Period12/4/2312/4/24

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Lee, H., Oh, C., & Hahn, J. W. (2012). Time-resolved absolute spectral analysis of IR countermeasure flares and its experimental validation by using an optical emission spectrometer with PbSe array detector. In Next-Generation Spectroscopic Technologies V [837408] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8374). https://doi.org/10.1117/12.918837