Time-resolved exciton recombination in CdTe/Cd1-xMn xTe multiple quantum wells

X. C. Zhang, S. K. Chang, A. V. Nurmikko, L. A. Kolodziejski, R. L. Gunshor, S. Datta

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Abstract

The lifetime of excitons in CdTe/Cd1-xMnxTe multiple quantum wells at low temperature has been measured by time-resolved photoluminescence in samples of different well thickness. The excitons, which have elsewhere been shown to be localized preferentially near the heterointerfaces, possess an average lifetime which becomes shorter with decreasing well thickness and increasing external magnetic field. The results are in qualitative agreement with the expectations for a localized quasi-two-dimensional exciton with a large radiative recombination cross section.

Original languageEnglish
Pages (from-to)59-61
Number of pages3
JournalApplied Physics Letters
Volume47
Issue number1
DOIs
Publication statusPublished - 1985 Dec 1

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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    Zhang, X. C., Chang, S. K., Nurmikko, A. V., Kolodziejski, L. A., Gunshor, R. L., & Datta, S. (1985). Time-resolved exciton recombination in CdTe/Cd1-xMn xTe multiple quantum wells. Applied Physics Letters, 47(1), 59-61. https://doi.org/10.1063/1.96404