ToF depth image motion blur detection using 3D blur shape models

Seungkyu Lee, Hyunjung Shim, James D.K. Kim, Chang Yeong Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

Time-of-flight cameras produce 3D geometry enabling faster and easier 3D scene capturing. The depth camera, however, suffers from motion blurs when the movement from either camera or scene appears. Unlike other noises, depth motion blur is hard to eliminate by any general filtering methods and yields the serious distortion in 3D reconstruction, typically causing uneven object boundaries and blurs. In this paper, we provide a through analysis on the ToF depth motion blur and a modeling method which is used to detect a motion blur region from a depth image. We show that the proposed method correctly detects blur regions using the set of all possible motion artifact models.

Original languageEnglish
Title of host publicationProceedings of SPIE-IS and T Electronic Imaging - Computational Imaging X
DOIs
Publication statusPublished - 2012
EventComputational Imaging X - Burlingame, CA, United States
Duration: 2012 Jan 232012 Jan 24

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8296
ISSN (Print)0277-786X

Other

OtherComputational Imaging X
CountryUnited States
CityBurlingame, CA
Period12/1/2312/1/24

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'ToF depth image motion blur detection using 3D blur shape models'. Together they form a unique fingerprint.

  • Cite this

    Lee, S., Shim, H., Kim, J. D. K., & Kim, C. Y. (2012). ToF depth image motion blur detection using 3D blur shape models. In Proceedings of SPIE-IS and T Electronic Imaging - Computational Imaging X [829615] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8296). https://doi.org/10.1117/12.908055