Top-gate ZnO thin-film transistors with a polymer dielectric designed for ultraviolet optical gating

Kimoon Lee, Jeong M. Choi, D. K. Hwang, Min Suk Oh, J. K. Kim, Y. Jung, K. Oh, Seongil Im

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

We report on the fabrication of ultraviolet (UV)-sensing top-gate ZnO thin-film transistors (TFTs) with a poly-4-vinylphenol (PVP) polymer gate dielectric on glass substrate. Our top-gate ZnO-TFT showed a field-effect mobility of 0.05 cm2/V s, maximum saturation current of 0.11 μA at a gate bias of 10 V and an on/off ratio of ∼103 in the dark. Under UV illumination with a wavelength of 364 nm the ZnO-TFT exhibited ∼4.7 μA for a drain current (at the same gate bias of 10 V), which is ∼50 times higher than without UV. Such photo-transistor action appeared more pronounced under a depletion regime of 0 V gate bias and the photo-to-dark current ratio was more than about 104. By adopting this high UV-sensitivity, our inverter device with the top-gate ZnO-TFT and a load resistance well demonstrated its optical gating behavior.

Original languageEnglish
Pages (from-to)69-73
Number of pages5
JournalSensors and Actuators, A: Physical
Volume144
Issue number1
DOIs
Publication statusPublished - 2008 May 28

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Electrical and Electronic Engineering

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