TOSCA: Total scan power reduction architecture based on pseudo-random built-in self test structure

Kim Youbean, Song Dongsup, Kim Kicheol, Kim Incheol, Kang Sungho

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Power of scan operation is dominant factor. This paper proposed the structure to reduce scan power totally. The total scan power reduction architecture uses a duplicated transition monitoring window and sub-scan chains. Experimental results show 60% transition reduction, 2∼4% fault coverage improvement, and 25% scan-in and 26% scan-out transition by the TOSCA.

Original languageEnglish
Title of host publicationProceedings of the 15th Asian Test Symposium 2006
Pages17-22
Number of pages6
DOIs
Publication statusPublished - 2006
Event15th Asian Test Symposium 2006 - Fukuoka, Japan
Duration: 2006 Nov 202006 Nov 23

Publication series

NameProceedings of the Asian Test Symposium
Volume2006
ISSN (Print)1081-7735

Other

Other15th Asian Test Symposium 2006
CountryJapan
CityFukuoka
Period06/11/2006/11/23

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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