Total internal reflection microscopy for surface plasmon scattering of a single Cu nanowire

Sang Youp Yim, Hong Gyu Ahn, Dae Geun Kim, Koo Chul Je, Honglyoul Ju, Moohyun Choi, Chang Woo Park, Seung Han Park

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A total internal reflection microscope was constructed to study surface plasmon scattering spectra of a single Cu nanowire. In particular, we have observed a strong surface plasmon peak in deep red region and the red-shift of the surface plasmon resonance as the diameter increases.

Original languageEnglish
Title of host publication2007 Conference on Lasers and Electro-Optics - Pacific Rim, CLEO/PACIFIC RIM
DOIs
Publication statusPublished - 2007 Dec 1
Event2007 Conference on Lasers and Electro-Optics - Pacific Rim, CLEO/PACIFIC RIM - Seoul, Korea, Republic of
Duration: 2007 Aug 262007 Aug 31

Publication series

NamePacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest

Other

Other2007 Conference on Lasers and Electro-Optics - Pacific Rim, CLEO/PACIFIC RIM
CountryKorea, Republic of
CitySeoul
Period07/8/2607/8/31

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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    Yim, S. Y., Ahn, H. G., Kim, D. G., Je, K. C., Ju, H., Choi, M., Park, C. W., & Park, S. H. (2007). Total internal reflection microscopy for surface plasmon scattering of a single Cu nanowire. In 2007 Conference on Lasers and Electro-Optics - Pacific Rim, CLEO/PACIFIC RIM [4391204] (Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest). https://doi.org/10.1109/CLEOPR.2007.4391204