Total internal reflection microscopy for surface plasmon scattering of a single cu nanowire

Sang Youp Yim, Hong Gyu Ahn, Dae Geun Kim, Koo Chul Je, Honglyoul Ju, Moohyun Choi, Chang Woo Park, Seung Han Park

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A total internal reflection microscope was constructed to study surface plasmon scattering spectra of a single Cu nanowire. In particular, we have observed a strong surface plasmon peak in deep red region and the red-shift of the surface plasmon resonance as the diameter increases.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2007
PublisherOptical Society of America
ISBN (Print)1424411742, 9781424411740
Publication statusPublished - 2007
EventConference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2007 - Seoul, Korea, Republic of
Duration: 2007 Aug 262007 Aug 26

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherConference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2007
CountryKorea, Republic of
CitySeoul
Period07/8/2607/8/26

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Yim, S. Y., Ahn, H. G., Kim, D. G., Je, K. C., Ju, H., Choi, M., Park, C. W., & Park, S. H. (2007). Total internal reflection microscopy for surface plasmon scattering of a single cu nanowire. In Conference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2007 (Optics InfoBase Conference Papers). Optical Society of America.