Tracing the initial state of surface oxidation in black phosphorus

Kyoung Hun Oh, Sung Won Jung, Keun Su Kim

Research output: Contribution to journalArticle

Abstract

Black phosphorus has emerged as a class of two-dimensional semiconductors, but its degradation caused by surface oxidation upon exposure to ambient conditions has been a serious issue. A key to understanding the mechanism of surface oxidation is the initial-state structure that has remained elusive. We study the initial state of surface oxidation in black phosphorus by low-temperature core-level photoelectron spectroscopy with the in situ dosage of O2 in the ultrahigh-vacuum condition. Our high-resolution P 2p core-level spectra show two clearly distinct initial-state components of P atoms that have one and two neighboring O atoms, respectively. It is followed by the rapid growth of other higher binding-energy components originating from incomplete P2O5 bonded to black phosphorus with one or two less bonds to O atoms. The variation in the proportion of these components reveals the initial-state structure of dissociative adsorption and its evolution to the final form of phosphorus oxides.

Original languageEnglish
Article number144341
JournalApplied Surface Science
Volume504
DOIs
Publication statusPublished - 2020 Feb 28

Fingerprint

tracing
Phosphorus
phosphorus
Oxidation
oxidation
phosphorus pentoxide
Core levels
phosphorus oxides
Atoms
atoms
ultrahigh vacuum
proportion
Ultrahigh vacuum
Photoelectron spectroscopy
binding energy
Binding energy
photoelectron spectroscopy
Oxides
degradation
dosage

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Cite this

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Tracing the initial state of surface oxidation in black phosphorus. / Oh, Kyoung Hun; Jung, Sung Won; Kim, Keun Su.

In: Applied Surface Science, Vol. 504, 144341, 28.02.2020.

Research output: Contribution to journalArticle

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