Tradeoff between hot carrier and negative bias temperature degradations in high-performance Si1 - XGex pMOSFETs with high-κ/metal gate stacks

Won Ho Choi, Chang Young Kang, Jung Woo Oh, Byoung Hun Lee, Prashant Majhi, Hyuk Min Kwon, Raj Jammy, Ga Won Lee, Hi Deok Lee

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3 Citations (Scopus)

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