Transparent stepped phase measurement using two illuminating beams

Behnam Tayebi, Farnaz Sharif, Mohammad Reza Jafar Fard, Dug Young Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

We propose a single shot and single wavelength phase imaging technique for measuring phase of the transparent objects without using unwrapping process. A grating between a laser and the object is used to make beams with different angle, which determines the measurement range of the microscope. The grating pitch and magnification of the lens system before the sample affect the angle. The angle inside the object is changed according to Snell's law; therefore, final angle is related to the refractive index of the object. Magnification of the lens system after sample will control the modulation frequency of microscope. The interference pattern is constructed at CCD plane and convey information of the sample. For a phase below the measurement range of the microscope, the reconstructed phase is not wrapped. By increasing the measurement range accuracy of the system will drop; therefore the magnification of the lenses must choose carefully to obtain optimal phase. The ability of this technique is demonstrated by reconstructing phases of two transparent step objects with 150 and 510 μm height. Their refractive indexes for red light are 1.515 and 1.508 , respectively. Therefore, total optical path length difference is 336 micrometers that is 500 times more than the laser wavelength. The phase is successfully reconstructed without using unwrapping algorithms.

Original languageEnglish
Title of host publicationInterferometry XVII
Subtitle of host publicationTechniques and Analysis
PublisherSPIE
Volume9203
ISBN (Electronic)9781628412307
DOIs
Publication statusPublished - 2014 Jan 1
EventInterferometry XVII: Techniques and Analysis - San Diego, United States
Duration: 2014 Aug 172014 Aug 19

Other

OtherInterferometry XVII: Techniques and Analysis
CountryUnited States
CitySan Diego
Period14/8/1714/8/19

Fingerprint

Phase Measurement
Phase measurement
illuminating
Lenses
rangefinding
Microscopes
magnification
Refractive index
microscopes
lenses
Wavelength
Microscope
Lasers
Lens
Angle
Frequency modulation
gratings
refractivity
Charge coupled devices
Refractive Index

All Science Journal Classification (ASJC) codes

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Tayebi, B., Sharif, F., Fard, M. R. J., & Kim, D. Y. (2014). Transparent stepped phase measurement using two illuminating beams. In Interferometry XVII: Techniques and Analysis (Vol. 9203). [920306-1] SPIE. https://doi.org/10.1117/12.2061619
Tayebi, Behnam ; Sharif, Farnaz ; Fard, Mohammad Reza Jafar ; Kim, Dug Young. / Transparent stepped phase measurement using two illuminating beams. Interferometry XVII: Techniques and Analysis. Vol. 9203 SPIE, 2014.
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Tayebi, B, Sharif, F, Fard, MRJ & Kim, DY 2014, Transparent stepped phase measurement using two illuminating beams. in Interferometry XVII: Techniques and Analysis. vol. 9203, 920306-1, SPIE, Interferometry XVII: Techniques and Analysis, San Diego, United States, 14/8/17. https://doi.org/10.1117/12.2061619

Transparent stepped phase measurement using two illuminating beams. / Tayebi, Behnam; Sharif, Farnaz; Fard, Mohammad Reza Jafar; Kim, Dug Young.

Interferometry XVII: Techniques and Analysis. Vol. 9203 SPIE, 2014. 920306-1.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Tayebi B, Sharif F, Fard MRJ, Kim DY. Transparent stepped phase measurement using two illuminating beams. In Interferometry XVII: Techniques and Analysis. Vol. 9203. SPIE. 2014. 920306-1 https://doi.org/10.1117/12.2061619