Trap density probing on top-gate MoS2 nanosheet field-effect transistors by photo-excited charge collection spectroscopy

Kyunghee Choi, Syed Raza Ali Raza, Hee Sung Lee, Pyo Jin Jeon, Atiye Pezeshki, Sung Wook Min, Jin Sung Kim, Woojin Yoon, Sang Yong Ju, Kimoon Lee, Seongil Im

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Chemistry

Engineering & Materials Science