Tribological characteristics of probe tip and PZT media for AFM-based recording technology

Koo Hyun Chung, Yong Ha Lee, Dae Eun Kim, Jingyoo Yoo, Seungbum Hong

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The reliability issue of the probe tip/recording media interface is one of the most crucial concerns in the Atomic Force Microscope (AFM)-based recording technology. In this work, a specialized doped silicon probe tip and a lead zirconate titanate, Pb(ZrXTi1-x)O3 (PZT) recording media were prepared for data recording based on ferroelectric interaction, and their tribological characteristics were assessed by performing wear tests using an AFM. The damage of the probe tip was quantitatively as well as qualitatively characterized by Field Emission Scanning Probe Microscope (FESEM) analysis. It was found that the wear coefficient of the probe tip was in the order of 10-4-10-2, and serious contamination at the end of the probe tip was observed. As for the PZT recording media, the AFM-based scratch test using the diamond coated probe tip was performed. It was shown that the wear rate was in the order of 10-7 mm3/N cycle.

Original languageEnglish
Title of host publicationAsia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages74-75
Number of pages2
ISBN (Electronic)0780387171, 9780780387171
DOIs
Publication statusPublished - 2004
Event2004 Asia-Pacific Magnetic Recording Conference, APMRC 2004 - Seoul, Korea, Republic of
Duration: 2004 Aug 162004 Aug 19

Publication series

NameAsia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004

Other

Other2004 Asia-Pacific Magnetic Recording Conference, APMRC 2004
CountryKorea, Republic of
CitySeoul
Period04/8/1604/8/19

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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    Chung, K. H., Lee, Y. H., Kim, D. E., Yoo, J., & Hong, S. (2004). Tribological characteristics of probe tip and PZT media for AFM-based recording technology. In Asia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004 (pp. 74-75). [1521957] (Asia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APMRC.2004.1521957