Tribological characteristics of probe tip and PZT media for AFM-based recording technology

Koo Hyun Chung; Yong Ha Lee; Dae Eun Kim; Jingyoo Yoo; Seungbum Hong

doi:10.1109/APMRC.2004.1521957

Tribological characteristics of probe tip and PZT media for AFM-based recording technology

Koo Hyun Chung, Yong Ha Lee, Dae Eun Kim, Jingyoo Yoo, Seungbum Hong

Department of Mechanical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The reliability issue of the probe tip/recording media interface is one of the most crucial concerns in the Atomic Force Microscope (AFM)-based recording technology. In this work, a specialized doped silicon probe tip and a lead zirconate titanate, Pb(Zr_XTi_1-x)O₃ (PZT) recording media were prepared for data recording based on ferroelectric interaction, and their tribological characteristics were assessed by performing wear tests using an AFM. The damage of the probe tip was quantitatively as well as qualitatively characterized by Field Emission Scanning Probe Microscope (FESEM) analysis. It was found that the wear coefficient of the probe tip was in the order of 10^-4-10^-2, and serious contamination at the end of the probe tip was observed. As for the PZT recording media, the AFM-based scratch test using the diamond coated probe tip was performed. It was shown that the wear rate was in the order of 10^-7 mm³/N cycle.

Original language	English
Title of host publication	Asia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	74-75
Number of pages	2
ISBN (Electronic)	0780387171, 9780780387171
DOIs	https://doi.org/10.1109/APMRC.2004.1521957
Publication status	Published - 2004
Event	2004 Asia-Pacific Magnetic Recording Conference, APMRC 2004 - Seoul, Korea, Republic of Duration: 2004 Aug 16 → 2004 Aug 19

Publication series

Name	Asia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004

Other

Other	2004 Asia-Pacific Magnetic Recording Conference, APMRC 2004
Country/Territory	Korea, Republic of
City	Seoul
Period	04/8/16 → 04/8/19

Bibliographical note

Publisher Copyright:
© 2004 IEEE.

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

Access to Document

10.1109/APMRC.2004.1521957

Cite this

Chung, K. H., Lee, Y. H., Kim, D. E., Yoo, J., & Hong, S. (2004). Tribological characteristics of probe tip and PZT media for AFM-based recording technology. In Asia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004 (pp. 74-75). [1521957] (Asia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APMRC.2004.1521957

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abstract = "The reliability issue of the probe tip/recording media interface is one of the most crucial concerns in the Atomic Force Microscope (AFM)-based recording technology. In this work, a specialized doped silicon probe tip and a lead zirconate titanate, Pb(ZrXTi1-x)O3 (PZT) recording media were prepared for data recording based on ferroelectric interaction, and their tribological characteristics were assessed by performing wear tests using an AFM. The damage of the probe tip was quantitatively as well as qualitatively characterized by Field Emission Scanning Probe Microscope (FESEM) analysis. It was found that the wear coefficient of the probe tip was in the order of 10-4-10-2, and serious contamination at the end of the probe tip was observed. As for the PZT recording media, the AFM-based scratch test using the diamond coated probe tip was performed. It was shown that the wear rate was in the order of 10-7 mm3/N cycle.",

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Chung, KH, Lee, YH, Kim, DE, Yoo, J & Hong, S 2004, Tribological characteristics of probe tip and PZT media for AFM-based recording technology. in Asia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004., 1521957, Asia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004, Institute of Electrical and Electronics Engineers Inc., pp. 74-75, 2004 Asia-Pacific Magnetic Recording Conference, APMRC 2004, Seoul, Korea, Republic of, 04/8/16. https://doi.org/10.1109/APMRC.2004.1521957

Tribological characteristics of probe tip and PZT media for AFM-based recording technology. / Chung, Koo Hyun; Lee, Yong Ha; Kim, Dae Eun et al.

Asia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004. Institute of Electrical and Electronics Engineers Inc., 2004. p. 74-75 1521957 (Asia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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Chung KH, Lee YH, Kim DE, Yoo J, Hong S. Tribological characteristics of probe tip and PZT media for AFM-based recording technology. In Asia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004. Institute of Electrical and Electronics Engineers Inc. 2004. p. 74-75. 1521957. (Asia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004). doi: 10.1109/APMRC.2004.1521957

Tribological characteristics of probe tip and PZT media for AFM-based recording technology

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