The reliability issue of the probe tip/recording media interface is one of the most crucial concerns in the Atomic Force Microscope (AFM)-based recording technology. In this work, a specialized doped silicon probe tip and a lead zirconate titanate, Pb(ZrXTi1-x)O3 (PZT) recording media were prepared for data recording based on ferroelectric interaction, and their tribological characteristics were assessed by performing wear tests using an AFM. The damage of the probe tip was quantitatively as well as qualitatively characterized by Field Emission Scanning Probe Microscope (FESEM) analysis. It was found that the wear coefficient of the probe tip was in the order of 10-4-10-2, and serious contamination at the end of the probe tip was observed. As for the PZT recording media, the AFM-based scratch test using the diamond coated probe tip was performed. It was shown that the wear rate was in the order of 10-7 mm3/N cycle.
|Title of host publication||Asia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|Number of pages||2|
|ISBN (Electronic)||0780387171, 9780780387171|
|Publication status||Published - 2004|
|Event||2004 Asia-Pacific Magnetic Recording Conference, APMRC 2004 - Seoul, Korea, Republic of|
Duration: 2004 Aug 16 → 2004 Aug 19
|Name||Asia-Pacific Magnetic Recording Conference 2004, Digest of APMRC 2004|
|Other||2004 Asia-Pacific Magnetic Recording Conference, APMRC 2004|
|Country||Korea, Republic of|
|Period||04/8/16 → 04/8/19|
Bibliographical notePublisher Copyright:
© 2004 IEEE.
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering