The reliability issue of probe tip/recording media interface is one of the most crucial concerns in the atomic force microscope (AFM)-based recording technology. In this work, a specialized doped silicon probe tip and a lead zirconate titanate, Pb(ZrxTi1-x)O3(PZT) recording media were prepared for data recording based on ferroelectric interaction, and their tribological characteristics were assessed by performing wear tests using an AFM. The damage of the probe tip was quantitatively as well as qualitatively characterized by field emission scanning electron microscope (FESEM) analysis. It was found that the wear coefficient of the probe tip was in the order of 10-410-2, and serious contamination at the end of the probe tip was observed. As for the PZT recording media, the AFM-based scratch test using the diamond coated probe tip was performed. It was shown that the wear rate was in the order of 10-8 mm3/N cycle.
Bibliographical noteFunding Information:
Manuscript received July 3, 2004.This work was supported in part by the Korea Ministry of Science and Technology through the National R&D program under Grant M1-0214-00-0199 and in part by Samsung Advanced Institute of Technology (SAIT).
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering