Ultrafast photocarrier dynamics related to defect states of Si1-: XGex nanowires measured by optical pump-THz probe spectroscopy

Jung Min Bae, Woo Jung Lee, Seonghoon Jung, Jin Won Ma, Kwang Sik Jeong, Seung Hoon Oh, Seongsin M. Kim, Dongchan Suh, Woobin Song, Sunjung Kim, Jaehun Park, Mann Ho Cho

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Physics

Material Science