Ultrafast terahertz spectroscopy of the inverse giant piezoresistance effect in silicon nanomembranes

Jaeseok Kim, Houk Jang, Min Seok Kim, Jeong Ho Cho, Jong Hyun Ahn, Hyunyong Choi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We observe the clear inverse piezoresistance effect in the silicon nanomembranes. Thickness-dependent optical-pump terahertz spectroscopy strongly corroborate that the effect originates from the carrier-concentration changes via charge carrier trapping into strain-induced defect states.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationQELS - Fundamental Science, CLEO_QELS 2015
PublisherOptical Society of America (OSA)
Pages1551p
ISBN (Electronic)9781557529688
DOIs
Publication statusPublished - 2015 May 4
EventCLEO: QELS - Fundamental Science, CLEO_QELS 2015 - San Jose, United States
Duration: 2015 May 102015 May 15

Publication series

NameCLEO: QELS - Fundamental Science, CLEO_QELS 2015

Other

OtherCLEO: QELS - Fundamental Science, CLEO_QELS 2015
CountryUnited States
CitySan Jose
Period15/5/1015/5/15

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All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Cite this

Kim, J., Jang, H., Kim, M. S., Cho, J. H., Ahn, J. H., & Choi, H. (2015). Ultrafast terahertz spectroscopy of the inverse giant piezoresistance effect in silicon nanomembranes. In CLEO: QELS - Fundamental Science, CLEO_QELS 2015 (pp. 1551p). (CLEO: QELS - Fundamental Science, CLEO_QELS 2015). Optical Society of America (OSA). https://doi.org/10.1364/CLEO_QELS.2015.FW3B.6