Ultrafast time-resolved photocurrent measurement of carrier escape dynamics in anisotropic ReS2

Hyemin Bae, Sangwan Sim, Taeyoung Kim, Doeon Lee, Dong Hwi Kim, Gwangmook Kim, Wooyoung Shim, Moon Ho Jo, Hyunyong Choi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report the two-pulse time-resolved photocurrent measurements in a group VII ReS2. The absence of bias dependence on the photocurrent recovery implies that the escape time of photoexcited carrier is much faster than electron-hole recombination.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationApplications and Technology, CLEO_AT 2018
PublisherOSA - The Optical Society
ISBN (Electronic)9781557528209
DOIs
Publication statusPublished - 2018 Jan 1
EventCLEO: Applications and Technology, CLEO_AT 2018 - San Jose, United States
Duration: 2018 May 132018 May 18

Publication series

NameOptics InfoBase Conference Papers
VolumePart F92-CLEO_AT 2018

Other

OtherCLEO: Applications and Technology, CLEO_AT 2018
CountryUnited States
CitySan Jose
Period18/5/1318/5/18

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

Cite this

Bae, H., Sim, S., Kim, T., Lee, D., Kim, D. H., Kim, G., Shim, W., Jo, M. H., & Choi, H. (2018). Ultrafast time-resolved photocurrent measurement of carrier escape dynamics in anisotropic ReS2. In CLEO: Applications and Technology, CLEO_AT 2018 (Optics InfoBase Conference Papers; Vol. Part F92-CLEO_AT 2018). OSA - The Optical Society. https://doi.org/10.1364/CLEO_AT.2018.JW2A.134