We report the two-pulse time-resolved photocurrent measurements in a group VII ReS2. The absence of bias dependence on the photocurrent recovery implies that the escape time of photoexcited carrier is much faster than electron-hole recombination.
|Title of host publication||CLEO|
|Subtitle of host publication||Applications and Technology, CLEO_AT 2018|
|Publisher||OSA - The Optical Society|
|Publication status||Published - 2018|
|Event||CLEO: Applications and Technology, CLEO_AT 2018 - San Jose, United States|
Duration: 2018 May 13 → 2018 May 18
|Name||Optics InfoBase Conference Papers|
|Volume||Part F92-CLEO_AT 2018|
|Other||CLEO: Applications and Technology, CLEO_AT 2018|
|Period||18/5/13 → 18/5/18|
Bibliographical notePublisher Copyright:
© OSA 2018.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Mechanics of Materials