We report the two-pulse time-resolved photocurrent measurements in a group VII ReS2. The absence of bias dependence on the photocurrent recovery implies that the escape time of photoexcited carrier is much faster than electron-hole recombination.
|Title of host publication||2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|Publication status||Published - 2018 Aug 6|
|Event||2018 Conference on Lasers and Electro-Optics, CLEO 2018 - San Jose, United States|
Duration: 2018 May 13 → 2018 May 18
|Name||2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings|
|Other||2018 Conference on Lasers and Electro-Optics, CLEO 2018|
|Period||18/5/13 → 18/5/18|
Bibliographical notePublisher Copyright:
© 2018 OSA.
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics