Ultrafast time-resolved photocurrent measurement of carrier escape dynamics in anisotropic ReS2

Hyemin Bae, Sangwan Sim, Taeyoung Kim, Doeon Lee, Dong Hwi Kim, Gwangmook Kim, Wooyoung Shim, Moon Ho Jo, Hyunyong Choi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report the two-pulse time-resolved photocurrent measurements in a group VII ReS2. The absence of bias dependence on the photocurrent recovery implies that the escape time of photoexcited carrier is much faster than electron-hole recombination.

Original languageEnglish
Title of host publication2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781943580422
Publication statusPublished - 2018 Aug 6
Event2018 Conference on Lasers and Electro-Optics, CLEO 2018 - San Jose, United States
Duration: 2018 May 132018 May 18

Publication series

Name2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

Other

Other2018 Conference on Lasers and Electro-Optics, CLEO 2018
CountryUnited States
CitySan Jose
Period18/5/1318/5/18

Fingerprint

Photocurrents
escape
photocurrents
recovery
Recovery
Electrons
pulses

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Bae, H., Sim, S., Kim, T., Lee, D., Kim, D. H., Kim, G., ... Choi, H. (2018). Ultrafast time-resolved photocurrent measurement of carrier escape dynamics in anisotropic ReS2 In 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings [8427390] (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings). Institute of Electrical and Electronics Engineers Inc..
Bae, Hyemin ; Sim, Sangwan ; Kim, Taeyoung ; Lee, Doeon ; Kim, Dong Hwi ; Kim, Gwangmook ; Shim, Wooyoung ; Jo, Moon Ho ; Choi, Hyunyong. / Ultrafast time-resolved photocurrent measurement of carrier escape dynamics in anisotropic ReS2 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2018. (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).
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title = "Ultrafast time-resolved photocurrent measurement of carrier escape dynamics in anisotropic ReS2",
abstract = "We report the two-pulse time-resolved photocurrent measurements in a group VII ReS2. The absence of bias dependence on the photocurrent recovery implies that the escape time of photoexcited carrier is much faster than electron-hole recombination.",
author = "Hyemin Bae and Sangwan Sim and Taeyoung Kim and Doeon Lee and Kim, {Dong Hwi} and Gwangmook Kim and Wooyoung Shim and Jo, {Moon Ho} and Hyunyong Choi",
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Bae, H, Sim, S, Kim, T, Lee, D, Kim, DH, Kim, G, Shim, W, Jo, MH & Choi, H 2018, Ultrafast time-resolved photocurrent measurement of carrier escape dynamics in anisotropic ReS2 in 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings., 8427390, 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings, Institute of Electrical and Electronics Engineers Inc., 2018 Conference on Lasers and Electro-Optics, CLEO 2018, San Jose, United States, 18/5/13.

Ultrafast time-resolved photocurrent measurement of carrier escape dynamics in anisotropic ReS2 . / Bae, Hyemin; Sim, Sangwan; Kim, Taeyoung; Lee, Doeon; Kim, Dong Hwi; Kim, Gwangmook; Shim, Wooyoung; Jo, Moon Ho; Choi, Hyunyong.

2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2018. 8427390 (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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T1 - Ultrafast time-resolved photocurrent measurement of carrier escape dynamics in anisotropic ReS2

AU - Bae, Hyemin

AU - Sim, Sangwan

AU - Kim, Taeyoung

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AU - Kim, Dong Hwi

AU - Kim, Gwangmook

AU - Shim, Wooyoung

AU - Jo, Moon Ho

AU - Choi, Hyunyong

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AB - We report the two-pulse time-resolved photocurrent measurements in a group VII ReS2. The absence of bias dependence on the photocurrent recovery implies that the escape time of photoexcited carrier is much faster than electron-hole recombination.

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Bae H, Sim S, Kim T, Lee D, Kim DH, Kim G et al. Ultrafast time-resolved photocurrent measurement of carrier escape dynamics in anisotropic ReS2 In 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2018. 8427390. (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).