Value-aware Parity Insertion ECC for Fault-tolerant Deep Neural Network

Seo Seok Lee, Joon Sung Yang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Deep neural networks (DNNs) are deployed on hardware devices and are widely used in various fields to perform inference from inputs. Unfortunately, hardware devices can become unreliable by incidents such as unintended process, voltage and temperature variations, and this can introduce the occurrence of erroneous weights. Prior study reports that the erroneous weights can cause a significant accuracy degradation. In safety-critical applications such as autonomous driving, it can bring catastrophic results. Retraining or fine-tuning can be used to adjust corrupted weights to prevent the accuracy degradation. However, training-based approaches would incur a significant computational overhead due to a massive size of training datasets and intensive training operations. Thus, this paper proposes a value-aware parity insertion error correction code (ECC) to recover erroneous weights with a reduced parity storage overhead and no additional training processes. Previous ECC-based reliability improvement methods, Weight Nulling and In-place Zero-space ECC, are compared with the proposed method. Experimental results demonstrate that DNNs with the value-aware parity insertion ECC can perform inference without the accuracy degradation, on average, in 122.5× and 15.1× higher bit error rate conditions over Weight Nulling and In-place Zero-space ECC, respectively.

Original languageEnglish
Title of host publicationProceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022
EditorsCristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages724-729
Number of pages6
ISBN (Electronic)9783981926361
DOIs
Publication statusPublished - 2022
Event2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022 - Virtual, Online, Belgium
Duration: 2022 Mar 142022 Mar 23

Publication series

NameProceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022

Conference

Conference2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022
Country/TerritoryBelgium
CityVirtual, Online
Period22/3/1422/3/23

Bibliographical note

Funding Information:
This work was supported by Samsung Electronics Co., Ltd. under project number 10201208-07834-01.

Publisher Copyright:
© 2022 EDAA.

All Science Journal Classification (ASJC) codes

  • Artificial Intelligence
  • Computer Networks and Communications
  • Hardware and Architecture
  • Software
  • Safety, Risk, Reliability and Quality
  • Control and Optimization

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