Wear characteristics of diamond-coated atomic force microscope probe

Koo Hyun Chung, Dae Eun Kim

Research output: Contribution to journalArticle

36 Citations (Scopus)

Abstract

In atomic force microscope (AFM) applications, the wear of the probe is undoubtedly a serious concern since it affects the integrity of the measurements. In this work, wear tests were performed using an AFM with lateral force monitoring capability with the aim to better understand the wear characteristics of diamond-coated probes. For the assessment of the probe wear, a transmission electron microscope (TEM) as well as a scanning electron microscope were utilized. The degree of the probe wear was quantified using the Archard's wear equation. The structure of the diamond-coated probe was analyzed by using the TEM and Raman spectroscopy. From the experimental results, two different wear characteristics, the gradual wear and the abrupt fracture of the diamond coating, were observed. In the case of gradual wear, the wear coefficient of the diamond-coated probe slid against a silicon nitride specimen was about 10-5-10-6. It was also found that the wear rate significantly decreased with increase in the sliding distance. Raman spectroscopy analysis showed that the difference in the chemical structure of the diamond coating may induce the different wear phenomena. These results may be effectively utilized for fundamental understanding of nano-wear characteristics of AFM probes.

Original languageEnglish
Pages (from-to)1-10
Number of pages10
JournalUltramicroscopy
Volume108
Issue number1
DOIs
Publication statusPublished - 2007 Dec 1

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Diamond
Diamonds
Microscopes
diamonds
microscopes
Wear of materials
probes
electron microscopes
Electron microscopes
Raman spectroscopy
coatings
Coatings
wear tests
silicon nitrides
integrity
Silicon nitride
sliding

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

Cite this

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Wear characteristics of diamond-coated atomic force microscope probe. / Chung, Koo Hyun; Kim, Dae Eun.

In: Ultramicroscopy, Vol. 108, No. 1, 01.12.2007, p. 1-10.

Research output: Contribution to journalArticle

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